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Navabi, Zainalabedin
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1

An Efficient RTL Design for a Wearable Brain–Computer Inter..:

Vasei, Tahereh ; Saber, Mohammad Ali ; Nahvy, Alireza..
IET Computers & Digital Techniques.  2024 (2024)  - p. 1-15 , 2024
Link: https://doi.org/10.1049/..
 
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2

Pico-Programmable Neurons to Reduce Computations for Deep N..:

Nahvy, Alireza ; Navabi, Zainalabedin
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.  32 (2024)  7 - p. 1216-1227 , 2024
Link: https://doi.org/10.1109/..
 
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3

Analysis and Enhancement of Resilience for LSTM Accelerator..:

Nosrati, Nooshin ; Navabi, Zainalabedin
IEEE Access.  12 (2024)  - p. 52851-52866 , 2024
Link: https://doi.org/10.1109/..
 
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4

Multi-Level Fault Injection Methodology Using UVM-SystemC:

, In: 2023 IEEE East-West Design & Test Symposium (EWDTS),
Nouri, Ebrahim ; Nosrati, Nooshin ; Asl, Hanieh Totonchi.. - p. 1-6 , 2023
Link: https://doi.org/10.1109/..
 
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5

Learning Electrical Behavior of Core Interconnects for Syst..:

, In: 2023 IEEE European Test Symposium (ETS),
Basharkhah, Katayoon ; Mirhashemi, Raheleh Sadat ; Nosrati, Nooshin.. - p. 1-6 , 2023
Link: https://doi.org/10.1109/..
 
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6

A Low-Cost Combinational Approximate Multiplier:

, In: 2023 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS),
Hojati, Zahra ; Navabi, Zainalabedin - p. 136-139 , 2023
Link: https://doi.org/10.1109/..
 
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7

A Low-cost Residue-based Scheme for Error-resiliency of RNN..:

, In: 2023 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS),
Nosrati, Nooshin ; Navabi, Zainalabedin - p. 83-86 , 2023
Link: https://doi.org/10.1109/..
 
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8

HIRMA: High-Performance Implementation for RISC-V Microcont..:

, In: 2023 IEEE East-West Design & Test Symposium (EWDTS),
Safari, Negin ; Joudi, Amirmahdi ; Rajabalipanah, Maryam... - p. 1-6 , 2023
Link: https://doi.org/10.1109/..
 
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9

Concurrent Error Detection for LSTM Accelerators:

, In: 2022 IEEE European Test Symposium (ETS),
Nosrati, Nooshin ; Ghasemi, Seyedeh Maryam ; Sadeghipour Roodsari, Mahboobe. - p. 1-2 , 2022
Link: https://doi.org/10.1109/..
 
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10

MLC: A Machine Learning Based Checker For Soft Error Detect..:

, In: 2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS),
Nosrati, Nooshin ; Jenihhin, Maksim ; Navabi, Zainalabedin - p. 1-5 , 2022
Link: https://doi.org/10.1109/..
 
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11

LUT Input Reordering to Reduce Aging Impact on FPGA LUTs:

Ebrahimi, Mohammad ; Sadeghi, Rezgar ; Navabi, Zainalabedin
IEEE Transactions on Computers.  69 (2020)  10 - p. 1500-1506 , 2020
Link: https://doi.org/10.1109/..
 
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12

Built-In Predictors for Dynamic Crosstalk Avoidance:

, In: 2020 IEEE European Test Symposium (ETS),
Sadeghi, Rezgar ; Navabi, Zainalabedin - p. 1-6 , 2020
Link: https://doi.org/10.1109/..
 
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13

Self-Adjusting Monitor for Measuring Aging Rate and Advance..:

Sadeghi-Kohan, Somayeh ; Kamal, Mehdi ; Navabi, Zainalabedin
IEEE Transactions on Emerging Topics in Computing.  8 (2020)  3 - p. 627-641 , 2020
Link: https://doi.org/10.1109/..
 
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14

DiBA: n-Dimensional Bitslice Architecture for LSTM Implemen..:

, In: 2020 23rd International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS),
Roodsari, Mahboobe Sadeghipour ; Ali Saber, Mohamad ; Navabi, Zainalabedin - p. 1-6 , 2020
Link: https://doi.org/10.1109/..
 
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15

Reducing DFT hardware overhead by use of a test microprogra..:

, In: 2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT),
Rajabalipanah, Maryam ; Ghasemi, Seyedeh Maryam ; Nosrati, Nooshin... - p. 1-4 , 2020
Link: https://doi.org/10.1109/..
 
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