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Nellist, PD
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1

Use of Partial Scattering EDX Cross-Sections to Quantify Li..:

Sheader, AA ; Nellist, PD
Microscopy and Microanalysis.  28 (2022)  S1 - p. 2448-2450 , 2022
Link: https://doi.org/10.1017/..
 
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2

Exploring the Validity Limits of Direct Ptychographic Metho..:

Clark, L ; Martinez, GT ; Liberti, E...
Microscopy and Microanalysis.  28 (2022)  S1 - p. 420-421 , 2022
Link: https://doi.org/10.1017/..
 
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3

Processing and Aberration-Corrected Imaging of Novel Low-Di..:

Nicolosi, V ; Aslam, Z ; Kim, J...
Microscopy and Microanalysis.  16 (2010)  S2 - p. 76-77 , 2010
Link: https://doi.org/10.1017/..
 
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4

Establishment of Annular Dark-Field Scanning Confocal Elect..:

Hashimoto, A ; Wang, P ; Shimojo, M...
Microscopy and Microanalysis.  16 (2010)  S2 - p. 1888-1889 , 2010
Link: https://doi.org/10.1017/..
 
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5

Three-Dimensional Resolution Limits and Image Contrast Mech..:

Nellist, PD ; Wang, P ; Behan, G...
Microscopy and Microanalysis.  16 (2010)  S2 - p. 1834-1835 , 2010
Link: https://doi.org/10.1017/..
 
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6

Three Dimensional Characterization of a Silica Hollow Spher..:

Takeguchi, M ; Okuda, M ; Hashimoto, A...
Microscopy and Microanalysis.  16 (2010)  S2 - p. 1836-1837 , 2010
Link: https://doi.org/10.1017/..
 
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7

Dopant Impurity Induced Nanofaceting on Silicon Nanowire Si..:

Li, F ; Nellist, PD ; Lang, C.
Microscopy and Microanalysis.  16 (2010)  S2 - p. 1740-1741 , 2010
Link: https://doi.org/10.1017/..
 
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8

Bloch wave analysis of depth dependent strain effects in hi..:

Nellist, PD ; Cosgriff, EC ; Hirsch, PB.
Microscopy and Microanalysis.  14 (2008)  S2 - p. 92-93 , 2008
Link: https://doi.org/10.1017/..
 
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9

Three-dimensional imaging and analysis by optical sectionin..:

Nellist, PD ; Cosgriff, EC ; Behan, G...
Microscopy and Microanalysis.  14 (2008)  S2 - p. 104-105 , 2008
Link: https://doi.org/10.1017/..
 
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10

Simulating Atomic Resolution STEM Images of Non-Periodic Sa..:

Findlay, SD ; D'Alfonso, AJ ; Allen, LJ...
Microscopy and Microanalysis.  14 (2008)  S2 - p. 928-929 , 2008
Link: https://doi.org/10.1017/..
 
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11

STM and HRTEM of Nanostructures and Metal Nanocrystals on S..:

Marsh, HL ; Deak, DS ; Silly, F...
Microscopy and Microanalysis.  13 (2007)  S02 - p. , 2007
Link: https://doi.org/10.1017/..
 
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12

Prospects for 3D Characterization of Materials by Aberratio..:

Nellist, PD ; Cosgriff, EC ; Behan, G.
Microscopy and Microanalysis.  13 (2007)  S02 - p. , 2007
Link: https://doi.org/10.1017/..
 
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13

Three-dimensional Characterisation of Nanomaterials Using A..:

Nellist, PD ; Cosgriff, EC ; Nicolosi, V.
Microscopy and Microanalysis.  12 (2006)  S02 - p. 1338-1339 , 2006
Link: https://doi.org/10.1017/..
 
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14

Atomistic understanding of the coherent interface between l..:

Rothmann, MU ; Lohmann, KB ; Borchert, J...
doi:10.1002/admi.202300249.  , 2023
Link: https://doi.org/10.1002/..
 
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15

Experimental reconstructions of 3D atomic structures from e..:

De Backer, A ; Van Aert, S ; Faes, C...
doi:10.1038/s41524-022-00900-w.  , 2023
Link: https://doi.org/10.1038/..
 
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