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2024 IEEE Aerospace Conference ,
5
TID Testing of SiGe Microelectronics Using High-Flux 1-MeV ..:
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2024 IEEE International Reliability Physics Symposium (IRPS) ,
6
Anomalous Mixed-Mode Damage Effects in SiGe HBTs at Cryogen..:
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2023 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS) ,
10