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Neuhäusler, T
8
results:
Search for persons
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Online (8)
Mediatypes
E-Books (1)
Articles (Online) (6)
OpenAccess-fulltext (1)
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?
1
Effect of Mechanical Strain and ATP on the Morphology of Cu..:
Felder, E
;
Grauvogel, F
;
Neuhäusler, T
..
Microscopy and Microanalysis. 13 (2007) S03 - p. 454-455 , 2007
Link:
https://doi.org/10.1017/..
?
2
The value and indicator function of patents
Studien zum deutschen Innovationssystem ; 15-2010
Walsh, J. P.
;
Devroede, R.
;
Du Plessis, M.
... , 2010
Link:
http://edok01.tib.uni-ha..
?
3
Imaging of micro- and nano-structures with hard X-rays:
Rau, C.
;
Crecea, V.
;
Richter, C.-P.
...
Micro & Nano Letters. 2 (2007) 1 - p. 1 , 2007
Link:
https://doi.org/10.1049/..
?
4
Synchrotron-based imaging and tomography with hard X-rays:
Rau, C.
;
Crecea, V.
;
Liu, W.
...
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 261 (2007) 1-2 - p. 850-854 , 2007
Link:
https://doi.org/10.1016/..
?
5
High-resolution actinic defect inspection for extreme ultra..:
Neuhäusler, U.
;
Oelsner, A.
;
Slieh, J.
...
Applied Physics Letters. 88 (2006) 5 - p. , 2006
Link:
https://doi.org/10.1063/..
?
6
Design, fabrication, and analysis of chirped multilayer mir..:
Wonisch, A.
;
Neuhäusler, U.
;
Kabachnik, N. M.
...
Applied Optics. 45 (2006) 17 - p. 4147 , 2006
Link:
https://doi.org/10.1364/..
?
7
A new approach for actinic defect inspection of EUVL multil..:
Neuhäusler, U.
;
Lin, J.
;
Oelsner, A.
...
Microelectronic Engineering. 83 (2006) 4-9 - p. 680-683 , 2006
Link:
https://doi.org/10.1016/..
?
8
The value and indicator function of patents:
Frietsch, Rainer
;
Schmoch, Ulrich
;
Van Looy, Baart
...
Series: Studien zum deutschen Innovationssystem. , 2010
Link:
http://hdl.handle.net/10..
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