Nier, Olivier
38  results:
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2

Ionizing Radiation Effects on Hole Collection Backside-Illu..:

Antonsanti, Aubin ; Goiffon, Vincent ; Roy, François...
IEEE Transactions on Nuclear Science.  70 (2023)  8 - p. 1958-1965 , 2023
 
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3

Radiation Characterization of a Backside-Illuminated P-Type..:

Malherbe, Victor ; Roy, Francois ; Nier, Olivier...
IEEE Transactions on Nuclear Science.  69 (2022)  3 - p. 534-541 , 2022
 
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6

Innovation in sport: innovation trajectories and process op.. 

Innovation, entrepreneurship, management series. Smart innovation set, volume 35
 
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13

Effective field and universal mobility in high-k metal gate..:

Nier, Olivier ; Rideau, Denis ; Cros, Antoine...
info:eu-repo/semantics/altIdentifier/doi/10.1109/ICMTS.2014.6841460.  , 2014
 
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14

Piezoresistivity in unstrained and strained SOI MOSFETs:

Berthelon, Rémy ; Cassé, Mikaël ; Rideau, Denis...
info:eu-repo/semantics/altIdentifier/doi/10.1109/S3S.2014.7028213.  , 2014
 
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15

Effective field and universal mobility in high-k metal gate..:

Nier, Olivier ; Rideau, Denis ; Cros, Antoine...
info:eu-repo/semantics/altIdentifier/doi/10.1109/ICMTS.2014.6841460.  , 2014
 
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