Niu, Jiebin
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3

Contact Length Scaling in Dual-Gate IGZO TFTs:

Wu, Zijing ; Niu, Jiebin ; Lu, Congyan...
IEEE Electron Device Letters.  45 (2024)  3 - p. 408-411 , 2024
 
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First Demonstration of Stacked 2T0C-DRAM Bit-Cell Construct..:

, In: 2023 International Electron Devices Meeting (IEDM),
Chen, Chuanke ; Xiang, Jinjuan ; Duan, Xinlv... - p. 1-4 , 2023
 
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Improved Multi-bit Statistics of Novel Dual-gate IGZO 2T0C ..:

, In: 2023 International Electron Devices Meeting (IEDM),
Chen, Kaifei ; Zhu, Zhengyong ; Lu, Wendong... - p. 1-4 , 2023
 
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