I agree that this site is using cookies. You can find further informations here.
X
Nonaka, Hidehiko
73  results:
Search for persons X
?
1

Final report on VAMAS round-robin study to evaluate a corre..:

Takano, Akio ; Nonaka, Hidehiko ; Homma, Yoshikazu...
Surface and Interface Analysis.  47 (2015)  6 - p. 681-700 , 2015
Link: https://doi.org/10.1002/..
 
?
2

VAMAS round‐robin study to evaluate a correction method for..:

Takano, Akio ; Nonaka, Hidehiko ; Homma, Yoshikazu...
Surface and Interface Analysis.  46 (2014)  S1 - p. 244-248 , 2014
Link: https://doi.org/10.1002/..
 
?
3

Stabilities and dissociation reactions of the Irm(CO)n+ ion..:

Nakanaga, Taisuke ; Nagai, Hidekazu ; Saito, Naoaki..
Chemical Physics Letters.  556 (2013)  - p. 44-48 , 2013
Link: https://doi.org/10.1016/..
 
?
4

Beam Characteristics of Positively and Negatively Charged D..:

Fujiwara, Yukio ; Saito, Naoaki ; Nonaka, Hidehiko.
Japanese Journal of Applied Physics.  51 (2012)  3R - p. 036701 , 2012
Link: https://doi.org/10.1143/..
 
?
5

Emission characteristics of a charged-droplet beam source u..:

Fujiwara, Yukio ; Saito, Naoaki ; Nonaka, Hidehiko.
Surface and Interface Analysis.  45 (2012)  1 - p. 517-521 , 2012
Link: https://doi.org/10.1002/..
 
?
6

Beam Characteristics of Positively and Negatively Charged D..:

Fujiwara, Yukio ; Saito, Naoaki ; Nonaka, Hidehiko.
Japanese Journal of Applied Physics.  51 (2012)  3R - p. 036701 , 2012
Link: https://doi.org/10.7567/..
 
?
7

Component analysis of a mixed beam generated by vacuum elec..:

Fujiwara, Yukio ; Saito, Naoaki ; Nonaka, Hidehiko.
Journal of Applied Physics.  111 (2012)  6 - p. , 2012
Link: https://doi.org/10.1063/..
 
?
8

Mass shift in the mass spectra of TOF-SIMS and the analysis..:

Nakanaga, Taisuke ; Nagai, Hidekazu ; Saito, Naoaki..
International Journal of Mass Spectrometry.  311 (2012)  - p. 24-30 , 2012
Link: https://doi.org/10.1016/..
 
?
9

Comparison of a new dead‐time correction method and convent..:

Takano, Akio ; Takenaka, Hisataka ; Ichimaru, Satoshi.
Surface and Interface Analysis.  44 (2012)  9 - p. 1287-1293 , 2012
Link: https://doi.org/10.1002/..
 
?
10

Plasma Diagnostics for NH3Plasmas Using a Quartz Sensor at ..:

Suzuki, Atsushi ; Nonaka, Hidehiko
Japanese Journal of Applied Physics.  50 (2011)  1S1 - p. 01AA03 , 2011
Link: https://doi.org/10.7567/..
 
?
11

Characteristics of a charged-droplet beam generated by vacu..:

Fujiwara, Yukio ; Saito, Naoaki ; Nonaka, Hidehiko..
Chemical Physics Letters.  501 (2011)  4-6 - p. 335-339 , 2011
Link: https://doi.org/10.1016/..
 
?
12

Plasma Diagnostics for NH3 Plasmas Using a Quartz Sensor at..:

Suzuki, Atsushi ; Nonaka, Hidehiko
Japanese Journal of Applied Physics.  50 (2011)  1S1 - p. 01AA03 , 2011
Link: https://doi.org/10.1143/..
 
?
13

Time‐of‐Flight secondary ion mass spectrometry (TOF‐SIMS) u..:

Fujiwara, Yukio ; Saito, Naoaki ; Nonaka, Hidehiko...
Surface and Interface Analysis.  43 (2011)  1-2 - p. 245-248 , 2011
Link: https://doi.org/10.1002/..
 
?
14

Measurement for dissociation ratio of source gases in plasm..:

Suzuki, Atsushi ; Nonaka, Hidehiko
Vacuum.  84 (2010)  12 - p. 1389-1392 , 2010
Link: https://doi.org/10.1016/..
 
?
15

A new cluster-ion-beam source for secondary ion mass spectr..:

Fujiwara, Yukio ; Saito, Naoaki ; Nonaka, Hidehiko..
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms.  268 (2010)  11-12 - p. 1938-1941 , 2010
Link: https://doi.org/10.1016/..
 
1-15