I agree that this site is using cookies. You can find further informations
here
.
X
Login
My folder (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
Show Desktop-Version
Toggle navigation
Norström, H.
141
results:
Search for persons
X
Format
Online (141)
Mediatypes
Articles (Online) (90)
Bookchapter (Online) (2)
OpenAccess-fulltext (49)
Sorted by: Relevance
Sorted by: Year
?
1
A Refined Polycide Gate Process with Silicided Diffusions f..:
Norström, H.
;
Nygren, S.
;
Johansson, T.
...
Journal of The Electrochemical Society. 136 (2019) 3 - p. 805-809 , 2019
Link:
https://doi.org/10.1149/..
?
2
LDMOS-transistors on semi-insulating silicon-on-polycrystal..:
Lotfi, S.
;
Li, L.-G.
;
Vallin, Ö.
...
Solid-State Electronics. 70 (2012) - p. 14-19 , 2012
Link:
https://doi.org/10.1016/..
?
3
Fabrication and Characterization of 150-mm Silicon-on-Polyc..:
Lotfi, S.
;
Li, L.-G.
;
Vallin, Ö.
..
Journal of Electronic Materials. 41 (2011) 3 - p. 480-487 , 2011
Link:
https://doi.org/10.1007/..
?
4
Oxygen out-diffusion from buried layers in SOI and SiC–SOI ..:
Li, L.-G.
;
Vallin, Ö.
;
Lu, J.
...
Solid-State Electronics. 54 (2010) 2 - p. 153-157 , 2010
Link:
https://doi.org/10.1016/..
?
5
Formation of a buried collector layer in RF-bipolar devices..:
Norström, H.
;
Johansson, T.
Microelectronics Journal. 37 (2006) 11 - p. 1366-1371 , 2006
Link:
https://doi.org/10.1016/..
?
6
Process-induced mechanical stress in isolation structures s..:
De Wolf, I.
;
Norström, H.
;
Maes, H. E.
Journal of Applied Physics. 74 (1993) 7 - p. 4490-4500 , 1993
Link:
https://doi.org/10.1063/..
?
7
A study of high-dose As and BF2implantations into SIMOX mat..:
Norstrom, H
;
Johansson, T
;
Vanhellemont, J
.
Semiconductor Science and Technology. 8 (1993) 5 - p. 630-633 , 1993
Link:
https://doi.org/10.1088/..
?
8
Micro-Raman study of stress distribution in local isolation..:
De Wolf, I.
;
Vanhellemont, J.
;
Romano-Rodríguez, A.
..
Journal of Applied Physics. 71 (1992) 2 - p. 898-906 , 1992
Link:
https://doi.org/10.1063/..
?
9
Implementation of a TiN cap layer into conventional self-al..:
Kaplan, W.
;
Zhang, S-L.
;
Norström, H.
..
Microelectronic Engineering. 19 (1992) 1-4 - p. 661-664 , 1992
Link:
https://doi.org/10.1016/..
?
10
Formation of CoSi2 and TiSi2 on narrow poly-Si lines:
Norström, H.
;
Maex, K.
;
Romano-Rodriguez, A.
.
Microelectronic Engineering. 14 (1991) 3-4 - p. 327-339 , 1991
Link:
https://doi.org/10.1016/..
?
11
Thermal stability and interface bowing of submicron TiSi2/p..:
Norström, H.
;
Maex, K.
;
Vandenabeele, P.
Thin Solid Films. 198 (1991) 1-2 - p. 53-66 , 1991
Link:
https://doi.org/10.1016/..
?
12
Characterization of a self-aligned RTP titanium disilicide ..:
Kaplan, W.
;
Zhang, S.-L.
;
Norström, H.
..
Applied Surface Science. 53 (1991) - p. 338-344 , 1991
Link:
https://doi.org/10.1016/..
?
13
Si/Ti/TiB2/Al structures investigated as contacts in microe..:
Larsson, T.
;
Wennström, U.
;
Norström, H.
...
Solid-State Electronics. 32 (1989) 5 - p. 385-389 , 1989
Link:
https://doi.org/10.1016/..
?
14
Thermal degradation of TiSi2/poly-Si gate electrodes:
Nygren, S.
;
Östling, M.
;
Petersson, C.S.
...
Thin Solid Films. 168 (1989) 2 - p. 325-334 , 1989
Link:
https://doi.org/10.1016/..
?
15
Dc-etching of poly-silicon with fluorine chemistry:
Blom, H-O
;
Nender, C
;
Berg, S
.
Vacuum. 38 (1988) 8-10 - p. 813-816 , 1988
Link:
https://doi.org/10.1016/..
1-15