Nurhisham, Muhammad
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1

Measurement of Aluminium Remnant Thickness on Copper Wire B..:

, In: 2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA),
 
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2

Design and simulation of a rooftop PV System in Taylor's Un..:

Krishna, Y ; Fauzan, M F ; Muhammad Nurhisham Gan, N B
Journal of Physics: Conference Series.  2120 (2021)  1 - p. 012035 , 2021
 
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3

Acceptance Criteria for Good Solder Joint Reliability On Wa..:

, In: 2023 IEEE 25th Electronics Packaging Technology Conference (EPTC),
 
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4

Package Fault Isolation for Low Density and Non-Metallic Pa..:

, In: 2022 IEEE 39th International Electronics Manufacturing Technology Conference (IEMT),
 
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