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Nysten, Johan
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1

Artificial neural network assisted spectral scatterometry f..:

Mattila, Aleksi ; Nysten, Johan ; Heikkinen, Ville...
Measurement Science and Technology.  35 (2024)  8 - p. 085025 , 2024
Link: https://doi.org/10.1088/..
 
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2

Phase-stepping interferometry for parallelism measurement o..:

Sharma, Sucheta ; Nysten, Johan ; Lassila, Antti.
Metrologia.  60 (2023)  5 - p. 055004 , 2023
Link: https://doi.org/10.1088/..
 
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3

Multi-sensor optical profilometer for measurement of large ..:

Heikkinen, Ville ; Nysten, Johan ; Byman, Ville..
Surface Topography: Metrology and Properties.  8 (2020)  4 - p. 045030 , 2020
Link: https://doi.org/10.1088/..
 
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4

Phase-stepping interferometry for parallelism measurement o..:

Sharma, Sucheta ; Nysten, Johan ; Lassila, Antti.
Metrologia.  , 2023
Link: https://aaltodoc.aalto.f..
 
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5

Multi-sensor optical profilometer for measurement of large ..:

Heikkinen, Ville ; Nysten, Johan ; Byman, Ville..
Heikkinen , V , Nysten , J , Byman , V , Hemming , B & Lassila , A 2020 , ' Multi-sensor optical profilometer for measurement of large freeforms at nm-level uncertainty ' , Surface Topography: Metrology and Properties , vol. 8 , no. 4 , 045030 . https://doi.org/10.1088/2051-672X/abd293.  , 2020
Link: https://cris.vtt.fi/en/p..
 
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6

High-Throughput Fabrication of Organic Nanowire Devices wit..:

Hu, Zhijun ; Muls, Benoît ; Gence, Loïk...
Nano Letters.  7 (2007)  12 - p. 3639-3644 , 2007
Link: https://doi.org/10.1021/..
 
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