O'Shea, Sean J.
206  results:
Search for persons X
?
1

Guidelines for the Design of Random Telegraph Noise-Based T..:

Zanotti, Tommaso ; Ranjan, Alok ; O'Shea, Sean J....
IEEE Transactions on Device and Materials Reliability.  24 (2024)  2 - p. 184-193 , 2024
 
?
2

Molecular Bridges Link Monolayers of Hexagonal Boron Nitrid..:

Ranjan, Alok ; O'Shea, Sean J. ; Padovani, Andrea...
ACS Applied Electronic Materials.  5 (2023)  2 - p. 1262-1276 , 2023
 
?
3

Adhesion Microscopy as a Nanoscale Probe for Oxidation and ..:

Ranjan, Alok ; Padovani, Andrea ; Dianat, Behnood...
ACS Applied Electronic Materials.  5 (2023)  9 - p. 5176-5186 , 2023
 
?
4

Reliability Analysis of Random Telegraph Noisebased True Ra..:

, In: 2023 IEEE International Integrated Reliability Workshop (IIRW),
 
?
5

Electrical Stress Induced Breakdown and Post Breakdown Phys..:

, In: 2023 IEEE Nanotechnology Materials and Devices Conference (NMDC),
Maruvada, Anirudh ; O'Shea, Sean J. ; Deng, Jie... - p. 452-456 , 2023
 
?
 
?
10

Localized Probing of Dielectric Breakdown in Multilayer Hex..:

Ranjan, Alok ; O'Shea, Sean J. ; Bosman, Michel..
ACS Applied Materials & Interfaces.  12 (2020)  49 - p. 55000-55010 , 2020
 
?
11

New Physics of Breakdown in 2D Hexagonal Boron Nitride Diel..:

, In: 2019 8th International Symposium on Next Generation Electronics (ISNE),
 
?
12

Effect of Electric Field and Trace Water on Confined Undeca..:

Soh, Eugene J. H. ; O'Shea, Sean J.
The Journal of Physical Chemistry C.  122 (2018)  6 - p. 3326-3333 , 2018
 
1-15