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Ochi, Mototaka
22  results:
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1

Low-Resistive Source/Drain Formation Using Nitrogen Plasma ..:

Tsuji, Hiroshi ; Takei, Tatsuya ; Ochi, Mototaka...
IEEE Journal of the Electron Devices Society.  10 (2022)  - p. 229-234 , 2022
Link: https://doi.org/10.1109/..
 
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2

7‐4: Late‐News‐Paper: Development of High‐mobility Top‐gate..:

Nakata, Mitsuru ; Ochi, Mototaka ; Takei, Tatsuya...
SID Symposium Digest of Technical Papers.  51 (2020)  1 - p. 79-82 , 2020
Link: https://doi.org/10.1002/..
 
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3

P‐4: High‐Mobility Back‐Channel‐Etched IGZTO‐TFT and Applic..:

Nakata, Mitsuru ; Ochi, Mototaka ; Takei, Tatsuya...
SID Symposium Digest of Technical Papers.  50 (2019)  1 - p. 1226-1229 , 2019
Link: https://doi.org/10.1002/..
 
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4

Sub-gap defect states in back-channel-etched amorphous In-G..:

, In: 2019 IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK),
Hayashi, Kazushi ; Ochi, Mototaka - p. 39-42 , 2019
Link: https://doi.org/10.1109/..
 
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5

A method for shortening effective channel length in oxide T..:

Nakata, Mitsuru ; Ochi, Mototaka ; Tsuji, Hiroshi...
Japanese Journal of Applied Physics.  58 (2019)  9 - p. 090602 , 2019
Link: https://doi.org/10.7567/..
 
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6

(Invited) Hydrogen-Related Trap States Induced during Fabri..:

Ochi, Mototaka ; Hino, Aya ; Goto, Hiroshi..
ECS Transactions.  86 (2018)  11 - p. 117-123 , 2018
Link: https://doi.org/10.1149/..
 
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7

Electrical Characterization of Zinc‐Rich Amorphous In‐Ga‐Zn..:

Ochi, Mototaka ; Hino, Aya ; Goto, Hiroshi..
physica status solidi (a).  215 (2018)  21 - p. , 2018
Link: https://doi.org/10.1002/..
 
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8

Evaluation of stress stabilities in amorphous In–Ga–Zn–O th..:

Ochi, Mototaka ; Hino, Aya ; Goto, Hiroshi...
Japanese Journal of Applied Physics.  57 (2017)  2S2 - p. 02CB06 , 2017
Link: https://doi.org/10.7567/..
 
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9

P‐1: Fabrication of a Short‐Channel Oxide TFT Utilizing the..:

Nakata, Mitsuru ; Ochi, Mototaka ; Tsuji, Hiroshi...
SID Symposium Digest of Technical Papers.  48 (2017)  1 - p. 1227-1230 , 2017
Link: https://doi.org/10.1002/..
 
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10

Improvement of Stress Stability in Back Channel Etch-Type A..:

Ochi, Mototaka ; Hino, Aya ; Goto, Hiroshi..
ECS Journal of Solid State Science and Technology.  6 (2017)  5 - p. P247-P252 , 2017
Link: https://doi.org/10.1149/..
 
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11

Improvement of Stress Stability in Back Channel Etch-Type T..:

Ochi, Mototaka ; Hino, Aya ; Goto, Hiroshi..
ECS Transactions.  75 (2016)  10 - p. 157-162 , 2016
Link: https://doi.org/10.1149/..
 
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12

Correlation of trap states with negative bias thermal illum..:

Hayashi, Kazushi ; Ochi, Mototaka ; Hino, Aya...
Japanese Journal of Applied Physics.  56 (2016)  3S - p. 03BB02 , 2016
Link: https://doi.org/10.7567/..
 
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13

Al-Based Metal Mesh Electrodes for Advanced Touch Screen Pa..:

OCHI, Mototaka ; SHIDA, Yoko ; OKUNO, Hiroyuki...
IEICE Transactions on Electronics.  E98.C (2015)  11 - p. 1000-1007 , 2015
Link: https://doi.org/10.1587/..
 
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14

Photoelectron emission yield experiments on evolution of su..:

Hayashi, Kazushi ; Hino, Aya ; Tao, Hiroaki...
Applied Physics Letters.  107 (2015)  11 - p. , 2015
Link: https://doi.org/10.1063/..
 
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15

57.2: Electrical Characterization of BCE‐TFTs with a‐IGZTO ..:

Ochi, Mototaka ; Morita, Shinya ; Takanashi, Yasuyuki...
SID Symposium Digest of Technical Papers.  46 (2015)  1 - p. 853-856 , 2015
Link: https://doi.org/10.1002/..
 
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