Oh, Jeonghoon
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2

Effect of Back Gate on Word Line Disturb Immunity of a Vert..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),
Jeong, Moonyoung ; Lee, Sangho ; Jun, Yootak... - p. P23.MR-1-P23.MR-4 , 2024
 
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3

Enhanced DRAM Single Bit Characteristics from Process Contr..:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),
Rim, Taiuk ; Che, Kyosuk ; Kwon, Sehyun... - p. 1-4 , 2023
 
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4

Investigation of Sub-20nm 4th generation DRAM cell transist..:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),
Jeong, Shinwoo ; Lee, Jin-Seong ; Jang, Jiuk... - p. 1-6 , 2023
 
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5

14nm DRAM Development and Manufacturing:

, In: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits),
Kim, Kanguk ; Son, Youngwoo ; Ryu, Hoin... - p. 1-2 , 2023
 
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6

Self-Aligned in 2Pitch Cell Array Transistor (S2CAT) for 4F..:

, In: 2023 International Electron Devices Meeting (IEDM),
Park, Seokhan ; Oh, Gyuhwan ; Yoo, Bowon... - p. 1-4 , 2023
 
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7

Efficacy of the Bonebridge BCI602 for Adult Patients with S..:

Kim, Hantai ; Park, Moo Kyun ; Park, Shi Nae...
Otolaryngology–Head and Neck Surgery.  170 (2023)  2 - p. 490-504 , 2023
 
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9

Computerized and functional reaction time in varsity-level ..:

Shumski, Eric J. ; Anderson, Melissa N. ; Oh, Jeonghoon..
Journal of Science and Medicine in Sport.  26 (2023)  3 - p. 189-194 , 2023
 
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10

Investigation on NBTI Control Techniques of HKMG Transistor..:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),
 
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11

Analysis of Intermittent Single-bit Failure on 10-nm node g..:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),
Seo, Hyewon ; Rim, Taiuk ; Lee, Eunsun... - p. 1-6 , 2023
 
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13

Influence of eccentric strength of knee extensor muscles on..:

Oh, Jeonghoon ; Lee, Hae-Dong
Journal of Electromyography and Kinesiology.  64 (2022)  - p. 102648 , 2022
 
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