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Ohlídal, I.
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1

Determination of local thickness values of non-uniform thin..:

Vodák, J ; Nečas, D ; Ohlídal, M.
Measurement Science and Technology.  28 (2017)  2 - p. 025205 , 2017
Link: https://doi.org/10.1088/..
 
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2

Measurement of the thickness distribution and optical const..:

Ohlídal, M ; Ohlídal, I ; Klapetek, P..
Measurement Science and Technology.  22 (2011)  8 - p. 085104 , 2011
Link: https://doi.org/10.1088/..
 
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3

Atomic force microscopy studies of cross-sections of column..:

Klapetek, P ; Ohlídal, I ; Buršík, J
Measurement Science and Technology.  18 (2007)  2 - p. 528-531 , 2007
Link: https://doi.org/10.1088/..
 
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4

Influence of lateral dimensions of the irregularities on th..:

Franta, D ; Ohlídal, I
Journal of Optics A: Pure and Applied Optics.  8 (2006)  9 - p. 763-774 , 2006
Link: https://doi.org/10.1088/..
 
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5

Spectroscopic ellipsometry on sinusoidal surface-relief gra..:

Antos, R. ; Ohlidal, I. ; Franta, D....
Applied Surface Science.  244 (2005)  1-4 - p. 221-224 , 2005
Link: https://doi.org/10.1016/..
 
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6

Spectroscopic ellipsometry on lamellar gratings:

Antos, R. ; Ohlidal, I. ; Mistrik, J....
Applied Surface Science.  244 (2005)  1-4 - p. 225-229 , 2005
Link: https://doi.org/10.1016/..
 
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7

Characterization of thin oxide films on GaAs substrates by ..:

Franta, D. ; Ohlídal, I. ; Klapetek, P..
Surface and Interface Analysis.  36 (2004)  8 - p. 1203-1206 , 2004
Link: https://doi.org/10.1002/..
 
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8

Characterization of the boundaries of thin films of TiO2 by..:

Franta, D. ; Ohlídal, I. ; Klapetek, P..
Surface and Interface Analysis.  34 (2002)  1 - p. 759-762 , 2002
Link: https://doi.org/10.1002/..
 
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9

Optical characterization of thin films non‐uniform in thick..:

Ohlídal, M. ; Ohlídal, I. ; Franta, D....
Surface and Interface Analysis.  34 (2002)  1 - p. 660-663 , 2002
Link: https://doi.org/10.1002/..
 
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10

Optical characterization of diamond-like carbon films using..:

Franta, D. ; Zajı́čková, L. ; Ohlı́dal, I...
Diamond and Related Materials.  11 (2002)  1 - p. 105-117 , 2002
Link: https://doi.org/10.1016/..
 
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11

Optical characterization of diamond-like carbon films:

Franta, D ; Zajı́čková, L ; Ohlı́dal, I.
Vacuum.  61 (2001)  2-4 - p. 279-283 , 2001
Link: https://doi.org/10.1016/..
 
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12

Analysis of inhomogeneous thin films of ZrO2 by the combine..:

Franta, D. ; Ohlídal, I. ; Klapetek, P...
Surface and Interface Analysis.  32 (2001)  1 - p. 91-94 , 2001
Link: https://doi.org/10.1002/..
 
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13

Determination of thicknesses and spectral dependences of re..:

Ohlı́dal, I. ; Franta, D. ; Ohlı́dal, M..
Vacuum.  61 (2001)  2-4 - p. 285-289 , 2001
Link: https://doi.org/10.1016/..
 
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14

Optical characterization of thin films with randomly rough ..:

Pavelka, R ; Ohlı́dal, I ; Hlávka, J..
Thin Solid Films.  366 (2000)  1-2 - p. 43-50 , 2000
Link: https://doi.org/10.1016/..
 
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15

Complete optical characterization of imperfect hydrogenated..:

Franta, D. ; Ohlídal, I. ; Munzar, D....
Thin Solid Films.  343-344 (1999)  - p. 295-298 , 1999
Link: https://doi.org/10.1016/..
 
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