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Ohlídal, Ivan
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1

Optical characterization of inhomogeneity of polymer-like t..:

Dvořák, Jan ; Vohánka, Jiří ; Buršíková, Vilma.
Heliyon.  10 (2024)  5 - p. e27246 , 2024
Link: https://doi.org/10.1016/..
 
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2

Multi-Wavelength Angle-Resolved Scattering of Randomly Roug..:

Šulc, Václav ; Vohánka, Jiří ; Ohlídal, Ivan...
Coatings.  13 (2023)  11 - p. 1853 , 2023
Link: https://doi.org/10.3390/..
 
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3

Optical Characterization of Inhomogeneous Thin Films Deposi..:

Dvořák, Jan ; Vohánka, Jiří ; Buršíková, Vilma..
Coatings.  13 (2023)  5 - p. 873 , 2023
Link: https://doi.org/10.3390/..
 
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4

Optical method for determining the power spectral density f..:

Vohánka, Jiří ; Šulc, Václav ; Ohlídal, Ivan..
Optik.  280 (2023)  - p. 170775 , 2023
Link: https://doi.org/10.1016/..
 
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5

Optical Characterization of Gadolinium Fluoride Films Using..:

Franta, Daniel ; Vohánka, Jiří ; Dvořák, Jan...
Coatings.  13 (2023)  2 - p. 218 , 2023
Link: https://doi.org/10.3390/..
 
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6

Optical characterization of inhomogeneous thin films with r..:

Vohánka, Jiří ; Ohlídal, Ivan ; Buršíková, Vilma..
Optics Express.  30 (2022)  2 - p. 2033 , 2022
Link: https://doi.org/10.1364/..
 
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7

Characterization of randomly rough surfaces using angle-res..:

Šustek, Štěpán ; Vohánka, Jiří ; Ohlídal, Ivan...
Journal of Optics.  23 (2021)  10 - p. 105602 , 2021
Link: https://doi.org/10.1088/..
 
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8

Determining shape of thickness non-uniformity using variabl..:

Vohánka, Jiří ; Šustek, Štěpán ; Buršíková, Vilma...
Applied Surface Science.  534 (2020)  - p. 147625 , 2020
Link: https://doi.org/10.1016/..
 
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9

Optics of Inhomogeneous Thin Films with Defects: Applicatio..:

Ohlídal, Ivan ; Vohánka, Jiří ; Čermák, Martin
Coatings.  11 (2020)  1 - p. 22 , 2020
Link: https://doi.org/10.3390/..
 
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10

Ellipsometric characterization of highly non-uniform thin f..:

Vohánka, Jiří ; Franta, Daniel ; Čermák, Martin...
Optics Express.  28 (2020)  4 - p. 5492 , 2020
Link: https://doi.org/10.1364/..
 
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11

Ellipsometric characterization of inhomogeneous thin films ..:

Ohlídal, Ivan ; Vohánka, Jiří ; Buršíková, Vilma...
Optics Express.  28 (2020)  24 - p. 36796 , 2020
Link: https://doi.org/10.1364/..
 
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12

Spectroscopic ellipsometry of inhomogeneous thin films exhi..:

Ohlídal, Ivan ; Vohánka, Jiří ; Buršíková, Vilma..
Optics Express.  28 (2019)  1 - p. 160 , 2019
Link: https://doi.org/10.1364/..
 
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13

Optical Characterization of Non-Stoichiometric Silicon Nitr..:

Vohánka, Jiří ; Ohlídal, Ivan ; Ohlídal, Miloslav...
Coatings.  9 (2019)  7 - p. 416 , 2019
Link: https://doi.org/10.3390/..
 
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14

Approximate methods for the optical characterization of inh..:

Ohlídal, Ivan ; Vohánka, Jiří ; Franta, Daniel...
Journal of Electrical Engineering.  70 (2019)  7 - p. 16-26 , 2019
Link: https://doi.org/10.2478/..
 
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15

Approximations of reflection and transmission coefficients ..:

Ohlídal, Ivan ; Vohánka, Jiří ; Mistrík, Jan...
Thin Solid Films.  692 (2019)  - p. 137189 , 2019
Link: https://doi.org/10.1016/..
 
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