Ohnuma, H.
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1

Noise Performance Improvements of 2-Layer Transistor Pixel ..:

, In: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits),
Kikuchi, Y. ; Tomita, M. ; Hayashi, T.... - p. 1-2 , 2023
 
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2

3D Sequential Process Integration for CMOS Image Sensor:

, In: 2021 IEEE International Electron Devices Meeting (IEDM),
Nakazawa, K. ; Yamamoto, J. ; Mori, S.... - p. 30.4.1-30.4.4 , 2021
 
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Effect of aluminum concentration on friction and wear prope..:

Ohnuma, H. ; Nihira, N. ; Mitsuo, A....
Surface and Coatings Technology.  177-178 (2004)  - p. 623-626 , 2004
 
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10

Test of the ANC method via (d,p) reaction:

Imai, N. ; Aoi, N. ; Kubono, S....
Nuclear Physics A.  688 (2001)  1-2 - p. 281-284 , 2001
 
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13

Impaired neural regulation of insulin secretion related to ..:

Ohnuma, H ; Yamatani, K ; Daimon, M...
Physiology & Behavior.  70 (2000)  5 - p. 527-532 , 2000
 
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