Ohshima, T.
1321  results:
Search for persons X
?
 
?
 
?
6

Soft- and Hard-Error Radiation Reliability of 228 KB $3\mat..:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),
Takahashi, H. ; Okamoto, Y. ; Hamada, T.... - p. 1-6 , 2023
 
?
12

Voltage Dependence of Single-Event Cross Sections of FinFET..:

Takeuchi, K. ; Sakamoto, K. ; Yukumatsu, K....
IEEE Transactions on Nuclear Science.  70 (2023)  8 - p. 1755-1759 , 2023
 
?
13

Modified divacancies in 4H-SiC:

Son, N. T. ; Shafizadeh, D. ; Ohshima, T..
Journal of Applied Physics.  132 (2022)  2 - p. , 2022
 
?
14

Creation of nitrogen-vacancy centers in chemical vapor depo..:

Luo, T ; Lindner, L ; Langer, J...
New Journal of Physics.  24 (2022)  3 - p. 033030 , 2022
 
1-15