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Olivo, Ricardo Revello
16  results:
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1

Efficient Characterization Methodology for Low-Frequency No..:

, In: 2024 IEEE 36th International Conference on Microelectronic Test Structures (ICMTS),
Pirro, Luca ; Chohan, Talha ; Liebscher, Philipp... - p. 1-5 , 2024
Link: https://doi.org/10.1109/..
 
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2

Low-Frequency Noise Sources and Back-Gate Coupling Effects ..:

, In: 2023 IEEE International Integrated Reliability Workshop (IIRW),
Yadav, Nandakishor ; Raffel, Yannick ; Olivo, Ricardo Revello... - p. 1-4 , 2023
Link: https://doi.org/10.1109/..
 
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3

Structural and Electrical Response of Emerging Memories Exp..:

Vogel, Tobias ; Zintler, Alexander ; Kaiser, Nico...
ACS Nano.  16 (2022)  9 - p. 14463-14478 , 2022
Link: https://doi.org/10.1021/..
 
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4

Synergistic Approach of Interfacial Layer Engineering and R..:

Raffel, Yannick ; De, Sourav ; Lederer, Maximilian...
ACS Applied Electronic Materials.  4 (2022)  11 - p. 5292-5300 , 2022
Link: https://doi.org/10.1021/..
 
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5

Synergistic Approach of Interfacial Layer Engineering and R..:

Raffel, Yannick ; De, Sourav ; Lederer, Maximilian...
http://www.ncbi.nlm.nih.gov/pmc/articles/PMC9686141/.  , 2022
Link: http://www.ncbi.nlm.nih...
 
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6

Structural and Electrical Response of Emerging Memories Exp..:

Vogel, Tobias ; Zintler, Alexander ; Kaiser, Nico...
http://www.ncbi.nlm.nih.gov/pmc/articles/PMC9527794/.  , 2022
Link: http://www.ncbi.nlm.nih...
 
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7

SPICE compatible semi-empirical compact model for ferroelec..:

Lederer, Maximilian ; Revello Olivo, Ricardo Orlando ; Yadav, Nandakishor...
Solid-State Electronics.  , 2023
Link: https://publica.fraunhof..
 
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8

Impact of Ferroelectric Layer Thickness on Reliability of B..:

Sünbül, Ayse ; Lehninger, David ; Hoffmann, Raik...
Advanced engineering materials.  , 2023
Link: https://publica.fraunhof..
 
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9

Effect of Al2O3 interlayers on the microstructure and elect..:

Lederer, Maximilian ; Seidel, Konrad ; Revello Olivo, Ricardo Orlando..
Frontiers in nanotechnology.  , 2022
Link: https://publica.fraunhof..
 
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10

Structural and Electrical Response of Emerging Memories Exp..:

Vogel, Tobias ; Zintler, Alexander ; Kaiser, Nico...
ACS nano.  , 2022
Link: https://publica.fraunhof..
 
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11

Synergistic Approach of Interfacial Layer Engineering and R..:

Raffel, Yannick ; De, Sourav ; Lederer, Maximilian...
ACS applied electronic materials.  , 2022
Link: https://publica.fraunhof..
 
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12

Heavy ion irradiation induced phase transitions and their i..:

Lederer, Maximilian ; Vogel, Tobias ; Kämpfe, Thomas...
Journal of applied physics.  , 2022
Link: https://publica.fraunhof..
 
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13

Hafnium oxide-based Ferroelectric Memories: Are we ready fo..:

, In: 2023 IEEE International Memory Workshop (IMW),
Seidel, Konrad ; Lehninger, David ; Muller, Franz... - p. 1-4 , 2023
Link: https://doi.org/10.1109/..
 
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14

Optimizing Ferroelectric and Interface Layers in HZO-Based ..:

Sunbul, Ayse ; Ali, Tarek ; Mertens, Konstantin...
IEEE Transactions on Electron Devices.  69 (2022)  2 - p. 808-815 , 2022
Link: https://doi.org/10.1109/..
 
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15

Memory Array Demonstration of fully integrated 1T-1C FeFET ..:

, In: 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits),
Seidel, Konrad ; Lehninger, David ; Hoffmann, Raik... - p. 355-356 , 2022
Link: https://doi.org/10.1109/..
 
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