Op de Beeck, Jonathan
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3

Nanoscale Localization of an Atom Probe Tip through Electri..:

Op de Beeck, Jonathan ; Fleischmann, C. ; Vandervorst, W..
The Journal of Physical Chemistry C.  124 (2019)  11 - p. 6371-6378 , 2019
 
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Direct Probing of the Dielectric Scavenging-Layer Interface..:

Celano, Umberto ; Op de Beeck, Jonathan ; Clima, Sergiu...
ACS Applied Materials & Interfaces.  9 (2017)  12 - p. 10820-10824 , 2017
 
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13

Optimal stomatal behaviour around the world:

Lin, Yan-Shih ; Medlyn, Belinda E ; Duursma, Remko A...
Versió postprint del document publicat a https://doi.org/10.1038/nclimate2550.  , 2018
 
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