Oshima, Kunihiro
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1

Design of Aging-Robust Clonable PUF Using an Insulator-Base..:

, In: 2024 29th Asia and South Pacific Design Automation Conference (ASP-DAC),
 
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3

OPTL: Robust and Area-Efficient Pass Gate Logic for Organic..:

, In: 2023 IEEE International Conference on Flexible and Printable Sensors and Systems (FLEPS),
 
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5

Layout-Dependent Vertical and In-Plane Leakage Current Redu..:

, In: 2022 IEEE 34th International Conference on Microelectronic Test Structures (ICMTS),
 
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7

Separation of bias stress degradation between insulator and..:

Oshima, Kunihiro ; Bian, Song ; Kuribara, Kazunori.
Japanese Journal of Applied Physics.  60 (2021)  SB - p. SBBG06 , 2021
 
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