Ostermaier, V.
11  results:
Search for persons X
?
 
?
2

Stress and Recovery Dynamics of Drain Current in GaN HD-GIT..:

Padovan, V. ; Koller, C. ; Pobegen, G...
Microelectronics Reliability.  100-101 (2019)  - p. 113482 , 2019
 
?
 
1-11