E-LIB Suche - Ergebnisse für: Oualid, J.

1

Influence of polycide deposition on the reliability of wet ..:

Yckache, K ; Boivin, P ; Baiget, F...
Journal of Non-Crystalline Solids. 245 (1999) 1-3 - p. 97-103 , 1999

Link: https://doi.org/10.1016/..

2

Electron traps created in gate oxides by Fowler–Nordheim in..:

Auriel, G. ; Oualid, J. ; Vuillaume, D.
Microelectronics Reliability. 38 (1998) 2 - p. 227-231 , 1998

Link: https://doi.org/10.1016/..

3

Methods to determine electron traps created in gate oxides ..:

Auriel, G. ; Dubuc, J.P. ; Sagnes, B..
Journal of Non-Crystalline Solids. 220 (1997) 2-3 - p. 157-163 , 1997

Link: https://doi.org/10.1016/..

4

New insights on the charging and discharging of electron tr..:

Auriel, G. ; Dubuc, J.P. ; Sagnes, B...
Microelectronic Engineering. 36 (1997) 1-4 - p. 309-312 , 1997

Link: https://doi.org/10.1016/..

5

Physical Properties of Polysilicon Diodes Derived from a Sm..:

Claverie, I. ; Oualid, J. ; Mille, J...
Solid State Phenomena. 51-52 (1996) - p. 567-572 , 1996

Link: https://doi.org/10.4028/..

6

Relaxation of the space charge created by Fowler–Nordheim i..:

Sagnes, B. ; Moragues, J. M. ; Yckache, K....
Journal of Applied Physics. 80 (1996) 9 - p. 5469-5477 , 1996

Link: https://doi.org/10.1063/..

7

Influence of WSi2 polysilicide gate process on integrity an..:

Moragues, J.M. ; Sagnes, B. ; Jerisian, R....
Journal of Non-Crystalline Solids. 187 (1995) - p. 156-159 , 1995

Link: https://doi.org/10.1016/..

8

Experiments and modelling to determine trapped holes and sl..:

Moragues, J.-M. ; Sagnes, B. ; Yckache, K....
Microelectronic Engineering. 28 (1995) 1-4 - p. 329-332 , 1995

Link: https://doi.org/10.1016/..

9

Surface potential determination in metal-oxide-semiconducto..:

Moragues, J. M. ; Ciantar, E. ; Jérisian, R...
Journal of Applied Physics. 76 (1994) 9 - p. 5278-5287 , 1994

Link: https://doi.org/10.1063/..

10

Coupling between the front and back interfaces in the gate-..:

Moragues, J.-M. ; Bouzidi, J. ; Ciantar, E....
Microelectronics Journal. 25 (1994) 4 - p. 307-322 , 1994

Link: https://doi.org/10.1016/..

11

Hot-carrier effects on leakage currents in MOSFETs—Modellin..:

Oualid, J. ; Burgniard, S. ; Ciantar, E..
Microelectronics Reliability. 33 (1993) 11-12 - p. 1759-1777 , 1993

Link: https://doi.org/10.1016/..

12

Effects of high field electron injection into the gate oxid..:

Moragues, J. M. ; Oualid, J. ; Jerisian, R..
Journal of Applied Physics. 74 (1993) 8 - p. 5078-5085 , 1993

Link: https://doi.org/10.1063/..

13

A Double-Blind Comparison of Terfenadine and Mequitazine in..:

Hugonot, L ; Hugonot, R ; Beaumont, D...
Journal of International Medical Research. 14 (1986) 3 - p. 124-130 , 1986

Link: https://doi.org/10.1177/..

14

Influence of illumination on the grain boundary recombinati..:

Oualid, J. ; Singal, C. M. ; Dugas, J...
Journal of Applied Physics. 55 (1984) 4 - p. 1195-1205 , 1984

Link: https://doi.org/10.1063/..

15

Dependence of electronic properties of polysilicon grain si..:

Mathian, G. ; Amzil, H. ; Zehaf, M....
Solid-State Electronics. 26 (1983) 2 - p. 131-141 , 1983

Link: https://doi.org/10.1016/..