Oviedo, Juan F
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Thermal-Electrical finite element analysis of nanometric co..:

Oviedo, Juan F ; Trojman, Lionel ; Kauerauf, Thomas.
https://revistas.usfq.edu.ec/index.php/avances/article/view/139/141.  , 2013
 
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5

Thermal-Electrical finite element analysis of nanometric co..:

Juan F. Oviedo ; Lionel Trojman ; Thomas Kauerauf.
http://revistas.usfq.edu.ec/index.php/avances/article/view/139.  , 2013
 
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