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1

Microcircuit Defect and Counterfeit Detection via Silicon G..:

, In: 2023 34th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC),

Moreno, Carlos ; Vibien, Philippe ; Pabbi, Srijan... - p. 1-6 , 2023

Link: https://doi.org/10.1109/..

2

Work-in-Progress: Boot Sequence Integrity Verification with..:

, In: 2022 International Conference on Embedded Software (EMSOFT),

Grisel-Davy, Arthur ; Bhogayata, Amrita Milan ; Pabbi, Srijan.. - p. 3-4 , 2022

Link: https://doi.org/10.1109/..

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