Padovan, V.
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3

Stress and Recovery Dynamics of Drain Current in GaN HD-GIT..:

Padovan, V. ; Koller, C. ; Pobegen, G...
Microelectronics Reliability.  100-101 (2019)  - p. 113482 , 2019
 
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4

Degradation Mechanisms of GaN HEMTs With p-Type Gate Under ..:

Ruzzarin, M. ; Meneghini, M. ; Barbato, A....
IEEE Transactions on Electron Devices.  65 (2018)  7 - p. 2778-2783 , 2018
 
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A model to predict the response of the benthic macroalga Sp..:

Townsend, S. A. ; Padovan, A. V.
River Research and Applications.  25 (2009)  9 - p. 1193-1203 , 2009
 
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Seasonal stratification and mixing in a recently flooded mi..:

Boland, K. T. ; Padovan, A. V.
Lakes & Reservoirs: Science, Policy and Management for Sustainable Use.  7 (2002)  2 - p. 125-131 , 2002
 
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9

Degradation Mechanisms of GaN HEMTs with p-Type Gate under ..:

Ruzzarin, M ; Meneghini, M ; Barbato, A...
info:eu-repo/semantics/altIdentifier/wos/WOS:000435546700015.  , 2018
 
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Sommario della nummografia : Veneziana fino alla caduta del..:

Padovan, V
http://mdz-nbn-resolving.de/urn:nbn:de:bvb:12-bsb10742182-0.  , 1866
 
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