Padovani, A.
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1

Estimating the Number of Defects in a Single Breakdown Spot..:

Ranjan, A. ; Padovani, A. ; Dianat, B....
IEEE Electron Device Letters.  45 (2024)  5 - p. 809-812 , 2024
 
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2

Self-rectifying non-volatile tunneling synapse: multiscale ..:

, In: 2024 IEEE International Memory Workshop (IMW),
Beltrando, B. ; Villena, M. A. ; Kumar, A.... - p. 1-4 , 2024
 
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3

The Role of Carrier Injection in the Breakdown Mechanism of..:

La Torraca, P. ; Padovani, A. ; Strand, J...
IEEE Electron Device Letters.  45 (2024)  2 - p. 236-239 , 2024
 
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6

Global uncertainty in the diagnosis of neurological complic..:

Tamborska, A.A. ; Wood, G.K. ; Westenberg, E....
Journal of the Neurological Sciences.  449 (2023)  - p. 120646 , 2023
 
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7

OC-0422 Treatment planning compliance rates in paediatric c..:

Kelly, S. ; Turcas, A. ; Corning, C....
Radiotherapy and Oncology.  182 (2023)  - p. S324-S325 , 2023
 
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11

Energy analysis of a hybrid electro-hydraulic system for ef..:

Padovani, D ; Rundo, M ; Fresia, P.
Journal of Physics: Conference Series.  2648 (2023)  1 - p. 012051 , 2023
 
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12

PO-1737 Profile of centres participating in paediatric radi..:

Turcas, A. ; Kelly, S. ; Clementel, E....
Radiotherapy and Oncology.  182 (2023)  - p. S1456-S1457 , 2023
 
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13

Corrigendum to "Global uncertainty in the diagnosis of neur..:

Tamborska, A.A. ; Wood, G.K. ; Westenberg, E....
Journal of the Neurological Sciences.  451 (2023)  - p. 120709 , 2023
 
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15

High-k/InGaAs interface defects at cryogenic temperature:

Cherkaoui, K. ; La Torraca, P. ; Lin, J....
Solid-State Electronics.  207 (2023)  - p. 108719 , 2023
 
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