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Padovani, Andrea
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1

From Accelerated to Operating Conditions: How Trapped Charg..:

Vecchi, Sara ; Padovani, Andrea ; Pavan, Paolo.
IEEE Transactions on Device and Materials Reliability.  24 (2024)  2 - p. 194-202 , 2024
Link: https://doi.org/10.1109/..
 
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2

Modeling Degradation and Breakdown in SiO2 and High-k Gate ..:

, In: 2023 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD),
Padovani, Andrea ; Torraca, Paolo La ; Larcher, Luca.. - p. 93-96 , 2023
Link: https://doi.org/10.23919..
 
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3

Molecular Bridges Link Monolayers of Hexagonal Boron Nitrid..:

Ranjan, Alok ; O'Shea, Sean J. ; Padovani, Andrea...
ACS Applied Electronic Materials.  5 (2023)  2 - p. 1262-1276 , 2023
Link: https://doi.org/10.1021/..
 
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4

Adhesion Microscopy as a Nanoscale Probe for Oxidation and ..:

Ranjan, Alok ; Padovani, Andrea ; Dianat, Behnood...
ACS Applied Electronic Materials.  5 (2023)  9 - p. 5176-5186 , 2023
Link: https://doi.org/10.1021/..
 
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5

Insights into device and material origins and physical mech..:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),
Pesic, Milan ; Beltrando, Bastien ; Rollo, Tommaso... - p. 1-8 , 2023
Link: https://doi.org/10.1109/..
 
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6

Device‐to‐Materials Pathway for Electron Traps Detection in..:

Slassi, Amine ; Medondjio, Linda‐Sheila ; Padovani, Andrea...
Advanced Electronic Materials.  9 (2023)  4 - p. , 2023
Link: https://doi.org/10.1002/..
 
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7

Electrically active defects in Al2O3-InGaAs MOS stacks at c..:

, In: 2023 IEEE International Integrated Reliability Workshop (IIRW),
La Torraca, Paolo ; Padovani, Andrea ; Wernersson, Lars-Erik... - p. 1-5 , 2023
Link: https://doi.org/10.1109/..
 
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8

Towards a Universal Model of Dielectric Breakdown:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),
Padovani, Andrea ; Torraca, Paolo La ; Strand, Jack... - p. 1-8 , 2023
Link: https://doi.org/10.1109/..
 
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9

A simple figure of merit to identify the first layer to deg..:

Padovani, Andrea ; La Torraca, Paolo
Microelectronic Engineering.  281 (2023)  - p. 112080 , 2023
Link: https://doi.org/10.1016/..
 
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10

The Major Effect of Trapped Charge on Dielectric Breakdown ..:

, In: 2023 IEEE International Integrated Reliability Workshop (IIRW),
Vecchi, Sara ; Padovani, Andrea ; Pavan, Paolo. - p. 1-7 , 2023
Link: https://doi.org/10.1109/..
 
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11

Pulse optimization and device engineering of 3D charge-trap..:

Anik Kumar, Mondol ; Padovani, Andrea ; Larcher, Luca..
Journal of Applied Physics.  132 (2022)  11 - p. , 2022
Link: https://doi.org/10.1063/..
 
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12

BELLO: A post-processing tool for the local-order analysis ..:

Dianat, Behnood ; Tavanti, Francesco ; Padovani, Andrea..
Computational Materials Science.  209 (2022)  - p. 111381 , 2022
Link: https://doi.org/10.1016/..
 
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13

Dielectric breakdown in HfO2 dielectrics: Using multiscale ..:

Strand, Jack ; La Torraca, Paolo ; Padovani, Andrea..
Journal of Applied Physics.  131 (2022)  23 - p. , 2022
Link: https://doi.org/10.1063/..
 
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14

Reliability of Non-Volatile Memory Devices for Neuromorphic..:

, In: 2022 IEEE International Reliability Physics Symposium (IRPS),
Padovani, Andrea ; Pesic, Milan ; Nardi, Federico... - p. 1-10 , 2022
Link: https://doi.org/10.1109/..
 
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15

Electron-assisted switching in FeFETs: Memory window dynami..:

, In: 2022 IEEE International Reliability Physics Symposium (IRPS),
Pesic, Milan ; Beltrando, Bastien ; Padovani, Andrea... - p. 4A.1-1-4A.1-8 , 2022
Link: https://doi.org/10.1109/..
 
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