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Paik, Yoonah
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1

The Breakthrough Memory Solutions for Improved Performance ..:

Kim, Byeongho ; Cha, Sanghoon ; Park, Sangsoo...
IEEE Micro.  44 (2024)  3 - p. 40-48 , 2024
Link: https://doi.org/10.1109/..
 
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2

Optimal Model Partitioning with Low-Overhead Profiling on t..:

Kim, Seok Young ; Lee, Jaewook ; Paik, Yoonah...
ACM Transactions on Design Automation of Electronic Systems.  29 (2024)  2 - p. 1-22 , 2024
Link: https://doi.org/10.1145/..
 
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3

PISA-DMA: Processing-in-Memory Instruction Set Architecture..:

Lee, Won Jun ; Kim, Chang Hyun ; Paik, Yoonah.
IEEE Access.  11 (2023)  - p. 8622-8632 , 2023
Link: https://doi.org/10.1109/..
 
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4

BL-PIM: Varying the Burst Length to Realize the All-Bank Pe..:

Kim, Chang Hyun ; Lee, Won Jun ; Paik, Yoonah..
IEEE Access.  11 (2023)  - p. 81143-81156 , 2023
Link: https://doi.org/10.1109/..
 
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5

Achieving the Performance of All-Bank In-DRAM PIM With Stan..:

Paik, Yoonah ; Kim, Chang Hyun ; Lee, Won Jun.
IEEE Access.  10 (2022)  - p. 93256-93272 , 2022
Link: https://doi.org/10.1109/..
 
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6

Silent-PIM: Realizing the Processing-in-Memory Computing Wi..:

Kim, Chang Hyun ; Lee, Won Jun ; Paik, Yoonah...
IEEE Transactions on Parallel and Distributed Systems.  33 (2022)  2 - p. 251-262 , 2022
Link: https://doi.org/10.1109/..
 
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7

Generating Representative Test Sequences from Real Workload..:

Paik, Yoonah ; Kim, Seon Wook ; Jung, Dongha.
ACM Transactions on Design Automation of Electronic Systems (TODAES).  25 (2020)  4 - p. 1-23 , 2020
Link: https://dl.acm.org/doi/1..
 
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8

Generating Representative Test Sequences from Real Workload..:

Paik, Yoonah ; Kim, Seon Wook ; Jung, Dongha.
ACM Transactions on Design Automation of Electronic Systems.  25 (2020)  4 - p. 1-23 , 2020
Link: https://doi.org/10.1145/..
 
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9

Fault Tolerance Technique Offlining Faulty Blocks by Heap M..:

Jun, Jaeyung ; Paik, Yoonah ; Min, Gyeong Il..
ACM Transactions on Design Automation of Electronic Systems (TODAES).  24 (2019)  4 - p. 1-25 , 2019
Link: https://dl.acm.org/doi/1..
 
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10

Fault Tolerance Technique Offlining Faulty Blocks by Heap M..:

Jun, Jaeyung ; Paik, Yoonah ; Min, Gyeong Il..
ACM Transactions on Design Automation of Electronic Systems.  24 (2019)  4 - p. 1-25 , 2019
Link: https://doi.org/10.1145/..
 
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11

Design of Processing-"Inside"-Memory Optimized for DRAM Beh..:

Lee, Won Jun ; Kim, Chang Hyun ; Paik, Yoonah...
IEEE Access.  7 (2019)  - p. 82633-82648 , 2019
Link: https://doi.org/10.1109/..
 
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12

High-throughput low-area design of AES using constant binar..:

Lee, Hokyoon ; Paik, Yoonah ; Jun, Jaeyung..
Microprocessors and Microsystems.  47 (2016)  - p. 360-368 , 2016
Link: https://doi.org/10.1016/..
 
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13

PISA-DMA: Processing-in-Memory Instruction Set Architecture..:

Won Jun Lee ; Chang Hyun Kim ; Yoonah Paik.
https://ieeexplore.ieee.org/document/10024282/.  , 2023
Link: https://doi.org/10.1109/..
 
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14

BL-PIM: Varying the Burst Length to Realize the All-Bank Pe..:

Chang Hyun Kim ; Won Jun Lee ; Yoonah Paik..
https://ieeexplore.ieee.org/document/10198428/.  , 2023
Link: https://doi.org/10.1109/..
 
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15

Achieving the Performance of All-Bank In-DRAM PIM With Stan..:

Yoonah Paik ; Chang Hyun Kim ; Won Jun Lee.
https://ieeexplore.ieee.org/document/9870805/.  , 2022
Link: https://doi.org/10.1109/..
 
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