Palestri, P.
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1

Comprehensive Analysis of Graphene Geometric Diodes: Role o..:

Truccolo, D. ; Palestri, P. ; Esseni, D...
IEEE Transactions on Electron Devices.  71 (2024)  2 - p. 1294-1301 , 2024
 
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Characterization and Advanced Modeling of Dielectric Defect..:

Asanovski, R. ; Arimura, H. ; de Marneffe, J.-F....
IEEE Transactions on Electron Devices.  71 (2024)  3 - p. 1745-1751 , 2024
 
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Probing Band Tail States in MOSFETs at Cryogenic Temperatur..:

, In: 2023 International Conference on Noise and Fluctuations (ICNF),
Asanovski, R. ; Grill, A. ; Franco, J.... - p. 1-4 , 2023
 
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Study of gain, noise, and collection efficiency of GaAs SAM..:

Colja, M. ; Cautero, M. ; Menk, R.H....
Journal of Instrumentation.  17 (2022)  12 - p. C12020 , 2022
 
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New insights on the excess 1/f noise at cryogenic temperatu..:

, In: 2022 International Electron Devices Meeting (IEDM),
Asanovski, R. ; Grill, A. ; Franco, J.... - p. 30.5.1-30.5.4 , 2022
 
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10

On the interpretation of MOS impedance data in both series ..:

Caruso, E. ; Lin, J. ; Monaghan, S....
Solid-State Electronics.  185 (2021)  - p. 108098 , 2021
 
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12

Experimental and simulation analysis of carrier lifetimes i..:

, In: 2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS),
Driussi, F. ; Pilotto, A. ; De Belli, D.... - p. 1-6 , 2020
 
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Full-Band Monte Carlo simulations of GaAs p-i-n Avalanche P..:

, In: 2020 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD),
Pilotto, A. ; Driussi, F. ; Esseni, D.... - p. 1-4 , 2020
 
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Effects of p doping on GaAs/AlGaAs SAM-APDs for X-rays dete..:

Nichetti, C. ; Steinhartova, T. ; Antonelli, M....
Journal of Instrumentation.  15 (2020)  2 - p. C02013-C02013 , 2020
 
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15

A model for the jitter of avalanche photodiodes with separa..:

Rosset, F. ; Pilotto, A. ; Selmi, L....
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment.  977 (2020)  - p. 164346 , 2020
 
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