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Palumbo, Felix
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1

Nonlinear Series Resistance Behavior in Schottky Diodes:

, In: 2024 Argentine Conference on Electronics (CAE),
Schiavoni, Leandro ; Liano, Lucas ; Palumbo, Felix... - p. 75-79 , 2024
Link: https://doi.org/10.1109/..
 
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2

High‐Temporal‐Resolution Characterization Reveals Outstandi..:

Pazos, Sebastian ; Becker, Thales ; Villena, Marco Antonio...
Advanced Functional Materials.  34 (2023)  15 - p. , 2023
Link: https://doi.org/10.1002/..
 
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3

Hardware implementation of a true random number generator i..:

Pazos, Sebastian ; Zheng, Wenwen ; Zanotti, Tommaso...
Nanoscale.  15 (2023)  5 - p. 2171-2180 , 2023
Link: https://doi.org/10.1039/..
 
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4

Analytic circuit model for thermal drying behavior of elect..:

Maroli, Gabriel ; Boyeras, Santiago ; Giannetta, Hernan...
Frontiers in Electronics.  3 (2023)  - p. , 2023
Link: https://doi.org/10.3389/..
 
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5

Printed electronics: a low-cost alternative to prototyping ..:

, In: 2023 Argentine Conference on Electronics (CAE),
Maroli, Gabriel ; Aymonino, Oscar Andres ; Oliva, Alejandro... - p. 69-74 , 2023
Link: https://doi.org/10.1109/..
 
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6

Physical origin of the permanent components of the positive..:

, In: 2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA),
Palumbo, Felix ; Klebanov, Maxim ; Monreal, Gerardo. - p. 1-5 , 2022
Link: https://doi.org/10.1109/..
 
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7

Temperature of Conductive Nanofilaments in Hexagonal Boron ..:

Lanza, Mario ; Palumbo, Felix ; Shi, Yuanyuan...
Advanced Electronic Materials.  8 (2022)  8 - p. , 2022
Link: https://doi.org/10.1002/..
 
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8

Decoupling the sequence of dielectric breakdown in single d..:

Aguirre, Fernando Leonel ; Ranjan, Alok ; Raghavan, Nagarajan...
Applied Physics Express.  14 (2021)  12 - p. 121001 , 2021
Link: https://doi.org/10.35848..
 
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9

On the Thermal Models for Resistive Random Access Memory Ci..:

Roldán, Juan B. ; González-Cordero, Gerardo ; Picos, Rodrigo...
Nanomaterials.  11 (2021)  5 - p. 1261 , 2021
Link: https://doi.org/10.3390/..
 
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10

Assessment and Improvement of the Pattern Recognition Perfo..:

Aguirre, Fernando L. ; Pazos, Sebastián M. ; Palumbo, Félix...
Electronics.  10 (2021)  19 - p. 2427 , 2021
Link: https://doi.org/10.3390/..
 
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11

Temperature of Conductive Nanofilaments in Hexagonal Boron ..:

Lanza, Mario ; Palumbo, Felix ; Shi, Yuanyuan...
Advanced Electronic Materials.  8 (2021)  8 - p. , 2021
Link: https://doi.org/10.1002/..
 
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12

SPICE Simulation of RRAM-Based Cross-Point Arrays Using the..:

Aguirre, Fernando L. ; Pazos, Sebastián M. ; Palumbo, Félix..
Frontiers in Physics.  9 (2021)  - p. , 2021
Link: https://doi.org/10.3389/..
 
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13

Minimization of the Line Resistance Impact on Memdiode-Base..:

Aguirre, Fernando Leonel ; Gomez, Nicolás M. ; Pazos, Sebastián Matías...
Journal of Low Power Electronics and Applications.  11 (2021)  1 - p. 9 , 2021
Link: https://doi.org/10.3390/..
 
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14

Standards for the Characterization of Endurance in Resistiv..:

Lanza, Mario ; Waser, Rainer ; Ielmini, Daniele...
ACS Nano.  15 (2021)  11 - p. 17214-17231 , 2021
Link: https://doi.org/10.1021/..
 
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15

Sensitive Devices and Phase Noise Degradation Mechanisms on..:

, In: 2020 Argentine Conference on Electronics (CAE),
Pazos, Sebastian M. ; Baudino, Juan J. ; Joglar, Matias N.... - p. 20-26 , 2020
Link: https://doi.org/10.1109/..
 
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