Pan, C.B.
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3

Si+ ion implanted MPS bulk GaN diodes:

Irokawa, Y. ; Kim, J. ; Ren, F....
Solid-State Electronics.  48 (2004)  5 - p. 827-830 , 2004
 
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AlGaN/GaN HEMT based liquid sensors:

Mehandru, R. ; Luo, B. ; Kang, B.S....
Solid-State Electronics.  48 (2004)  2 - p. 351-353 , 2004
 
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Reduction of Surface-Induced Current Collapse in AlGaN/GaN ..:

Irokawa, Y. ; Luo, B. ; Ren, F....
Electrochemical and Solid-State Letters.  7 (2004)  9 - p. G188 , 2004
 
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2.6 A, 0.69 MW cm−2 single-chip bulk GaN p-i-n rectifier:

Irokawa, Y. ; Luo, B. ; Kang, B.S....
Solid-State Electronics.  48 (2004)  2 - p. 359-361 , 2004
 
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7

MgO/p-GaN enhancement mode metal-oxide semiconductor field-..:

Irokawa, Y. ; Nakano, Y. ; Ishiko, M....
Applied Physics Letters.  84 (2004)  15 - p. 2919-2921 , 2004
 
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Lateral schottky GaN rectifiers formed by Si+ ion implantat..:

Irokawa, Y. ; Kim, Jihyun ; Ren, F....
Journal of Electronic Materials.  33 (2004)  5 - p. 426-430 , 2004
 
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10

DC Characteristics of AlGaN/GaN Heterostructure Field-Effec..:

Irokawa, Y. ; Luo, B. ; Ren, F....
Electrochemical and Solid-State Letters.  7 (2004)  1 - p. G8 , 2004
 
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11

GaN/AlGaN HEMTs grown by hydride vapor phase epitaxy on AlN..:

LaRoche, J.R. ; Luo, B. ; Ren, F....
Solid-State Electronics.  48 (2004)  1 - p. 193-196 , 2004
 
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Effect of external strain on the conductivity of AlGaN/GaN ..:

Kang, B. S. ; Kim, S. ; Kim, J....
Applied Physics Letters.  83 (2003)  23 - p. 4845-4847 , 2003
 
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Current–voltage and reverse recovery characteristics of bul..:

Irokawa, Y. ; Luo, B. ; Kim, Jihyun...
Applied Physics Letters.  83 (2003)  11 - p. 2271-2273 , 2003
 
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Activation kinetics of implanted Si+ in GaN and application..:

Irokawa, Y. ; Kim, Jihyun ; Ren, F....
Applied Physics Letters.  83 (2003)  24 - p. 4987-4989 , 2003
 
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