Pan, Jieming
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4

High-Performance Top-Gated and Double-Gated Oxide–Semicondu..:

Chen, Chun-Kuei ; Hooda, Sonu ; Fang, Zihang...
IEEE Transactions on Electron Devices.  70 (2023)  4 - p. 2098-2105 , 2023
 
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6

Negative-U Defect Passivation in Oxide-Semiconductor by Cha..:

, In: 2023 International Electron Devices Meeting (IEDM),
Chen, Chun-Kuei ; Xu, Zefeng ; Hooda, Sonu... - p. 1-4 , 2023
 
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13

First Demonstration of Ultra-low Dit Top-Gated Ferroelectri..:

, In: 2022 International Electron Devices Meeting (IEDM),
Chen, Chun-Kuei ; Fang, Zihang ; Hooda, Sonu... - p. 6.1.1-6.1.4 , 2022
 
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14

Low-Thermal-Budget BEOL-Compatible Beyond-Silicon Transisto..:

, In: 2022 International Electron Devices Meeting (IEDM),
Thean, Aaron ; Tsai, Shih-Hao ; Chen, Chun-Kuei... - p. 12.2.1-12.2.4 , 2022
 
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15

Stress-Memorized HZO for High-Performance Ferroelectric Fie..:

Tsai, Shih-Hao ; Fang, Zihang ; Wang, Xinghua...
ACS Applied Electronic Materials.  4 (2022)  4 - p. 1642-1650 , 2022
 
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