E-LIB Suche - Ergebnisse für: Papadopoulos, Alex S.

1

On the Kolmogorov-Smirnov test for the Poisson distribution..:

Papadopoulos, Alex S. ; Qiao, Ning
Journal of Interdisciplinary Mathematics. 6 (2003) 1 - p. 65-82 , 2003

Link: https://doi.org/10.1080/..

2

The Burr type XII distribution as a failure model under var..:

Moore, Deborah ; Papadopoulos, Alex S.
Microelectronics Reliability. 40 (2000) 12 - p. 2117-2122 , 2000

Link: https://doi.org/10.1016/..

3

On the test of liu and chow's procedure for assessing equiv..:

Chen, Keh-Wei ; Papadopoulos, Alex S. ; Chung Chow, Shein
Communications in Statistics - Simulation and Computation. 26 (1997) 3 - p. 1129-1138 , 1997

Link: https://doi.org/10.1080/..

4

Shortest bayes credibility intervals for the lognormal fail..:

Chen, Keh-Wei ; Papadopoulos, Alex S.
Microelectronics Reliability. 37 (1997) 12 - p. 1859-1863 , 1997

Link: https://doi.org/10.1016/..

5

Some Robustness Issues In The Bayesian Analysis of A Weibul..:

Papadopoulos, Alex S. ; Hoekstra, Robert M.
Journal of Statistical Computation and Simulation. 52 (1995) 1 - p. 85-94 , 1995

Link: https://doi.org/10.1080/..

6

Bayesian approach for BOD and DO when the discharged pollut..:

Papadopoulos, Alex S. ; Tiwari, Ram C.
Ecological Modelling. 71 (1994) 4 - p. 245-257 , 1994

Link: https://doi.org/10.1016/..

7

On the Bayes Estimators of the Probability of "Success" and..:

Kyriakoussis, A. ; Papadopoulos, Alex S.
Sankhyā: The Indian Journal of Statistics, Series B (1960-2002). 55 (1993) 2 - p. 171-185 , 1993

Link: https://www.jstor.org/st..

8

Hierarchical confidence bounds for the exponential failure ..:

Papadopoulos, Alex S.
Microelectronics Reliability. 33 (1993) 5 - p. 719-727 , 1993

Link: https://doi.org/10.1016/..

9

The zero-truncated negative binomial distribution as a fail..:

Kyriakoussis, A. ; Papadopoulos, Alex S.
Microelectronics Reliability. 32 (1992) 1-2 - p. 259-264 , 1992

Link: https://doi.org/10.1016/..

10

Comparison of Bayesian nonparametric estimates of the relia..:

Papadopoulos, Alex S. ; Tiwari, Ram C.
Microelectronics Reliability. 32 (1992) 1-2 - p. 233-240 , 1992

Link: https://doi.org/10.1016/..

11

Bootstrap procedures for time series analysis of BOD data:

Papadopoulos, Alex S. ; Tiwari, Ram C. ; Muha, Michael J.
Ecological Modelling. 55 (1991) 1-2 - p. 57-65 , 1991

Link: https://doi.org/10.1016/..

12

The logarithmic series distribution as a failure model from..:

Kyriakoussis, A. ; Papadopoulos, Alex S.
Microelectronics Reliability. 30 (1990) 1 - p. 133-139 , 1990

Link: https://doi.org/10.1016/..

13

Bayesian approach to life testing and reliability estimatio..:

Papadopoulos, Alex S. ; Tiwari, Ram C.
Microelectronics Reliability. 29 (1989) 6 - p. 1039-1050 , 1989

Link: https://doi.org/10.1016/..

14

On Bayes estimation for mixtures of two Weibull distributio..:

Chen, Keh-Wei ; Papadopoulos, Alex S. ; Tamer, Patrick
Microelectronics Reliability. 29 (1989) 4 - p. 609-617 , 1989

Link: https://doi.org/10.1016/..

15

A nonparametric method for estimating the joint probability..:

Chen, Keh-Wei ; Papadopoulos, Alex S.
Ecological Modelling. 41 (1988) 3-4 - p. 183-191 , 1988

Link: https://doi.org/10.1016/..