Park, Chuntaek
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2

Thermal modeling of 7 nm node bulk fin-shaped field-effect ..:

Park, Chuntaek ; Yun, Ilgu
Semiconductor Science and Technology.  33 (2018)  11 - p. 115014 , 2018
 
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3

Universal core model for multiple-gate field-effect transis..:

Shin, Yong Hyeon ; Bae, Min Soo ; Park, Chuntaek...
Semiconductor Science and Technology.  33 (2018)  6 - p. 065010 , 2018
 
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4

Mechanical stress-induced degradation model of amorphous In..:

Park, Chuntaek ; Yun, Ilgu
Microelectronics Reliability.  76-77 (2017)  - p. 592-595 , 2017
 
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10

Power managements of a hybrid electric propulsion system fo..:

Lee, Bohwa ; Park, Poomin ; Kim, Chuntaek..
Journal of Mechanical Science and Technology.  26 (2012)  8 - p. 2291-2299 , 2012
 
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