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Park, Jin‐Gyu
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1

Correction: Achievement of Green and Sustainable CVD Throug..:

Baek, Song Yi ; Park, Jingyu ; Koh, Taeyoung...
International Journal of Precision Engineering and Manufacturing-Green Technology.  11 (2024)  4 - p. 1435-1435 , 2024
Link: https://doi.org/10.1007/..
 
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2

Influence of RF power in the sputter deposition of amorphou..:

Lee, Da Yeon ; Park, Jingyu ; Lee, Sangwon...
Solid-State Electronics.  216 (2024)  - p. 108921 , 2024
Link: https://doi.org/10.1016/..
 
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3

Achievement of Green and Sustainable CVD Through Process, E..:

Baek, Song Yi ; Park, Jingyu ; Koh, Taeyoung...
International Journal of Precision Engineering and Manufacturing-Green Technology.  11 (2024)  4 - p. 1295-1316 , 2024
Link: https://doi.org/10.1007/..
 
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4

Floating body effect in indium–gallium–zinc–oxide (IGZO) th..:

Park, Jingyu ; Go, Seungwon ; Chae, Woojun...
Scientific Reports.  14 (2024)  1 - p. , 2024
Link: https://doi.org/10.1038/..
 
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5

Spatial Degradation Profiling Technique in Self-Aligned Top..:

Park, Jingyu ; Choi, Sungju ; Myoung, Seung Joo...
IEEE Electron Device Letters.  44 (2023)  1 - p. 96-99 , 2023
Link: https://doi.org/10.1109/..
 
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6

Analysis of a-InGaZnO TFT Threshold Voltage Instability and..:

Lee, Sangwon ; Park, Jingyu ; Yang, Ga Won...
IEEE Electron Device Letters.  44 (2023)  1 - p. 88-91 , 2023
Link: https://doi.org/10.1109/..
 
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7

Fowler–Nordheim Stress-Induced Degradation of Buried-Channe..:

Choi, Sungju ; Yang, Ga Won ; Lee, Sangwon...
IEEE Transactions on Electron Devices.  70 (2023)  1 - p. 48-52 , 2023
Link: https://doi.org/10.1109/..
 
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8

Current Boosting of Self‐Aligned Top‐Gate Amorphous InGaZnO..:

Park, Jingyu ; Choi, Sungju ; Kim, Changwook...
Advanced Electronic Materials.  9 (2023)  3 - p. , 2023
Link: https://doi.org/10.1002/..
 
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9

Lifetime estimation of thin-film transistors in organic emi..:

Park, Jingyu ; Choi, Sungju ; Kim, Changwook...
Scientific Reports.  13 (2023)  1 - p. , 2023
Link: https://doi.org/10.1038/..
 
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10

The Role of Vanadium Complexes with Glyme Ligands in Suppre..:

Lee, Jungho ; Park, Jingyu ; Ha, Kwang-Ho...
Journal of Electrochemical Science and Technology.  14 (2023)  2 - p. 152-161 , 2023
Link: https://doi.org/10.33961..
 
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11

Excessive Oxygen Peroxide Model‐Based Analysis of Positive‐..:

Choi, Sungju ; Park, Jingyu ; Hwang, Seong‐Hyun...
Advanced Electronic Materials.  8 (2022)  5 - p. , 2022
Link: https://doi.org/10.1002/..
 
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12

Physics-Based Compact Model of Current Stress-Induced Thres..:

Yang, Tae Jun ; Park, Jingyu ; Choi, Sungju...
IEEE Electron Device Letters.  43 (2022)  10 - p. 1685-1688 , 2022
Link: https://doi.org/10.1109/..
 
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13

Total Subgap Range Density of States-Based Analysis of the ..:

Yang, Ga Won ; Park, Jingyu ; Choi, Sungju...
IEEE Transactions on Electron Devices.  69 (2022)  1 - p. 166-173 , 2022
Link: https://doi.org/10.1109/..
 
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14

Structural and electronic properties with respect to Si dop..:

Lee, Byeong Hyeon ; Park, Jingyu ; Kumar, Akash...
Materials Today Communications.  33 (2022)  - p. 104809 , 2022
Link: https://doi.org/10.1016/..
 
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15

Excessive Oxygen Peroxide Model‐Based Analysis of Positive‐..:

Choi, Sungju ; Park, Jingyu ; Hwang, Seong‐Hyun...
Advanced Electronic Materials.  8 (2022)  5 - p. , 2022
Link: https://doi.org/10.1002/..
 
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