Park, Sung-Ho
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2

Reliability Improvement in Vertical NAND Flash Cells Using ..:

Park, Sung-Ho ; Yoo, Ho-Nam ; Yang, Yeongheon..
IEEE Transactions on Electron Devices.  71 (2024)  3 - p. 1834-1838 , 2024
 
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3

Vertical AND-Type Flash TFT Array Capable of Accurate Vecto..:

Im, Jiseong ; Kim, Jangsaeng ; Hwang, Joon...
IEEE Electron Device Letters.  45 (2024)  7 - p. 1385-1388 , 2024
 
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Development of In-Pipe Inspection Robot for Large-Diameter ..:

, In: Intelligent Autonomous Systems 18; Lecture Notes in Networks and Systems,
Jeon, Kwang-Woo ; Chung, Hyun-Joon ; Jung, Eui-Jung... - p. 443-452 , 2024
 
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7

Experimental and Numerical Investigation of Cu-Cu Direct Bo..:

, In: 2024 IEEE 74th Electronic Components and Technology Conference (ECTC),
Oh, Sung-Hyun ; Lee, Hyun-Dong ; Lee, Jae-Uk... - p. 1628-1632 , 2024
 
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8

On-Chip Learning in Vertical NAND Flash Memory Using Forwar..:

Park, Sung-Ho ; Ko, Jonghyun ; Lee, In-Seok...
IEEE Transactions on Electron Devices.  71 (2024)  6 - p. 3640-3644 , 2024
 
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10

Comparative Analysis of n- and p-Type Ferroelectric Tunnel ..:

Koo, Ryun-Han ; Shin, Wonjun ; Ryu, Sangwoo...
IEEE Electron Device Letters.  44 (2023)  10 - p. 1624-1627 , 2023
 
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