Park, Tai-su
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1

Electrical Characteristics of Ultrashallow p[sup +]∕n Junct..:

Lee, Dongkyu ; Heo, Sungho ; Cho, Changhee...
Electrochemical and Solid-State Letters.  9 (2006)  4 - p. G121 , 2006
 
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2

Ultra Shallow Junction Formation Using Plasma Doping and La..:

Yon, Guk-Hyon ; Buh, Gyoung Ho ; Park, Tai-su...
Japanese Journal of Applied Physics.  45 (2006)  4S - p. 2961 , 2006
 
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4

Elimination of surface state induced edge transistors in hi..:

Lee, Jin-Wook ; Buh, Gyoung Ho ; Yon, Guk-Hyon...
Microelectronics Reliability.  45 (2005)  9-11 - p. 1394-1397 , 2005
 
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5

Device Design Consideration for 50 nm Dynamic Random Access..:

Han, Kyoung-Rok ; Choi, Byung-Kil ; Park, Tai-su...
Japanese Journal of Applied Physics.  44 (2005)  4S - p. 2176 , 2005
 
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6

Threshold Voltage Behavior of Body-Tied FinFET (OMEGA MOSFE..:

Park, Tai-su ; Cho, Hye Jin ; Choe, Jeong Dong...
Japanese Journal of Applied Physics.  43 (2004)  4S - p. 2180 , 2004
 
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7

Isotropic/Anisotropic Selective Epitaxial Growth of Si on L..:

Lim, Seung-Hyun ; Song, Sukchan ; Park, Tai-su...
Japanese Journal of Applied Physics.  42 (2003)  Part 1, No. 6B - p. 3966-3970 , 2003
 
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8

A body-tied FinFET (OMEGA MOSFET) using bulk Si wafer:

Park, Tai-su ; Yoon, Euijoon ; Lee, Jong-Ho
Physica E: Low-dimensional Systems and Nanostructures.  19 (2003)  1-2 - p. 6-12 , 2003
 
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15

Risk of Coronavirus Disease 2019 Occurrence, Severe Present..:

Yang, Bumhee ; Choi, Hayoung ; Lee, Sun-Kyung...
Cancer Research and Treatment.  53 (2021)  3 - p. 678-684 , 2021
 
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