E-LIB Suche - Ergebnisse für: Park, Young Kwan

1

P‐143: TSP Pattern Design and Sensitivity Characterization ..:

Park, Hyun Sung ; Jeong, Choong Min ; Jeong, Keuk Jin...
SID Symposium Digest of Technical Papers. 50 (2019) 1 - p. 1763-1766 , 2019

Link: https://doi.org/10.1002/..

2

InGaAs inversion layers band structure, electrostatics, and..:

Pham, Anh-Tuan ; Jin, Seonghoon ; Choi, Woosung...
Solid-State Electronics. 113 (2015) - p. 79-85 , 2015

Link: https://doi.org/10.1016/..

3

A unified model for unipolar resistive random access memory:

Lee, Kwangseok ; Jang, Jung-Shik ; Kwon, Yongwoo...
Applied Physics Letters. 100 (2012) 8 - p. , 2012

Link: https://doi.org/10.1063/..

4

Titelbild: Crystal Structure and Guest Uptake of a Mesoporo..:

Park, Young Kwan ; Choi, Sang Beom ; Kim, Hyunuk...
Angewandte Chemie. 119 (2007) 43 - p. 8237-8237 , 2007

Link: https://doi.org/10.1002/..

5

Cover Picture: Crystal Structure and Guest Uptake of a Meso..:

Park, Young Kwan ; Choi, Sang Beom ; Kim, Hyunuk...
Angewandte Chemie International Edition. 46 (2007) 43 - p. 8091-8091 , 2007

Link: https://doi.org/10.1002/..

6

Crystal Structure and Guest Uptake of a Mesoporous Metal–Or..:

Park, Young Kwan ; Choi, Sang Beom ; Kim, Hyunuk...
Angewandte Chemie. 119 (2007) 43 - p. 8378-8381 , 2007

Link: https://doi.org/10.1002/..

7

Crystal Structure and Guest Uptake of a Mesoporous Metal–Or..:

Park, Young Kwan ; Choi, Sang Beom ; Kim, Hyunuk...
Angewandte Chemie International Edition. 46 (2007) 43 - p. 8230-8233 , 2007

Link: https://doi.org/10.1002/..

8

Sensing Margin Analysis of MLC Flash Memories Using a Novel..:

, In: Proceedings of the 7th International Symposium on Quality Electronic Design,

Kim, Young-Gu ; Lee, Sang-Hoon ; Kim, Dae-Han... - p. 185-189 , 2006

Link: https://dl.acm.org/doi/1..

9

Programming Characteristics of Phase Change Random Access M..:

Kim, Young-Tae ; Hwang, Young-Nam ; Lee, Keun-Ho...
Japanese Journal of Applied Physics. 44 (2005) 4S - p. 2701 , 2005

Link: https://doi.org/10.1143/..

10

Simulation of Photoresist Thermal Flow Process with Viscous..:

Chung, Won-Young ; Kim, Tai-Kyung ; Lee, Yero...
Japanese Journal of Applied Physics. 43 (2004) 9R - p. 6020 , 2004

Link: https://doi.org/10.1143/..

11

Improving the ESD performance of input protection circuits ..:

Park, Young-Kwan ; Kang, Tae-Hun ; Choi, Chang-Hoon..
Microelectronics Reliability. 37 (1997) 10-11 - p. 1461-1464 , 1997

Link: https://doi.org/10.1016/..

12

Influence of Preferred Gate Metal Grain Orientation on Tunn..:

Choi, Kyoung Min ; Lee, Won-Sok ; Lee, Keun-Ho..
IEEE Transactions on Electron Devices, Vol.62 No.4, pp.1353-1356. , 2022

Link: https://hdl.handle.net/1..

13

A Finite Element Model for Bipolar Resistive Random Access ..:

Kim, Kwanyong ; Lee, Kwangseok ; Lee, Keun-Ho..
JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE, Vol.14 No.3, pp.268-273. , 2022

Link: https://hdl.handle.net/1..

14

General Geometric Fluctuation Modeling for Device Variabili..:

Fu, Bo ; Jin, Seonghoon ; Choi, Woosung..
http://arxiv.org/abs/1506.00964. , 2015

Link: http://arxiv.org/abs/150..

15

13.2 A 32Gb 8.0Gb/s/pin DDR5 SDRAM with a Symmetric-Mosaic ..:

, In: 2024 IEEE International Solid-State Circuits Conference (ISSCC),

Choi, Ikjoon ; Hong, Seunghwan ; Kim, Kihyun... - p. 234-236 , 2024

Link: https://doi.org/10.1109/..