E-LIB Suche - Ergebnisse für: Park, Young-June

1

Uniformly scalable and stackable porous transport layer man..:

Park, Seong Hyun ; Koo, Jongun ; Park, Young-June...
Chemical Engineering Journal. 481 (2024) - p. 148276 , 2024

Link: https://doi.org/10.1016/..

2

Dissolution of Ti porous transport layer in proton exchange..:

Cho, Junsic ; Kim, Dong Hyun ; Noh, Min Wook...
Journal of Materials Chemistry A. , 2024

Link: https://doi.org/10.1039/..

3

A 3D-printed flow distributor with uniform flow rate contro..:

Park, Young-June ; Yu, Taejong ; Yim, Se-Jun..
Lab on a Chip. 18 (2018) 8 - p. 1250-1258 , 2018

Link: https://doi.org/10.1039/..

4

Highly efficient and continuous production of few-layer bla..:

Choi, Chang-Ho ; Park, Young-June ; Wu, Xiaoge.
Chemical Engineering Journal. 333 (2018) - p. 336-342 , 2018

Link: https://doi.org/10.1016/..

5

Modeling the geometric effects on programming characteristi..:

Jeon, Kwang Sun ; Choe, Kyu Sik ; Choi, Seongwook..
Solid-State Electronics. 79 (2013) - p. 117-124 , 2013

Link: https://doi.org/10.1016/..

6

Conduction Mechanism and Low Frequency Noise Analysis in Al..:

Lee, Myoung-Sun ; Lee, Jung-Kyu ; Hwang, Hyun-Sang...
Japanese Journal of Applied Physics. 50 (2011) 1R - p. 011501 , 2011

Link: https://doi.org/10.7567/..

7

Conduction Mechanism and Low Frequency Noise Analysis in Al..:

Lee, Myoung-Sun ; Lee, Jung-Kyu ; Hwang, Hyun-Sang...
Japanese Journal of Applied Physics. 50 (2011) 1R - p. 011501 , 2011

Link: https://doi.org/10.1143/..

8

Device degradation model for polysilicon-oxide-nitride-oxid..:

Yi, Jeong-Hyong ; Lee, Sang-Don ; Ahn, Jin-Hong...
Microelectronic Engineering. 80 (2005) - p. 329-332 , 2005

Link: https://doi.org/10.1016/..

9

Effects of Oleamide on Choline Acetyltransferase and Cognit..:

HEO, Ho-Jin ; PARK, Young-June ; SUH, Young-Min...
Bioscience, Biotechnology, and Biochemistry. 67 (2003) 6 - p. 1284-1291 , 2003

Link: https://doi.org/10.1271/..

10

A new hole mobility model for hydrodynamic simulation:

Lee, Chanho ; Kim, Jung-Sik ; Shin, Hyungsoon..
Microelectronics Reliability. 40 (2000) 12 - p. 2019-2022 , 2000

Link: https://doi.org/10.1016/..

11

Electrical properties of SOI n-MOSFETs under nonisothermal ..:

Kim, Jin-Yang ; Park, Young-June ; Min, Hong-Shick
Solid-State Electronics. 41 (1997) 4 - p. 567-573 , 1997

Link: https://doi.org/10.1016/..

12

Optimization study of halo doped MOSFETs:

Song, Duheon ; Lim, Junhee ; Lee, Kyungho..
Solid-State Electronics. 39 (1996) 6 - p. 923-927 , 1996

Link: https://doi.org/10.1016/..

13

An isotropic two band model for hot electron transport in s..:

Jin, Gyoyoung ; Dutton, Robert W. ; Park, Young-June.
Journal of Applied Physics. 78 (1995) 5 - p. 3174-3184 , 1995

Link: https://doi.org/10.1063/..

14

A New Recessed Channel Metal-Oxide-Semiconductor Field-Effe..:

Lee, Woo-Hyeong ; Young-June Park, Young-June Park ; Jong Duk Lee, Jong Duk Lee
Japanese Journal of Applied Physics. 33 (1994) 1S - p. 529 , 1994

Link: https://doi.org/10.1143/..

15

0507 A Novel Machine Learning Model to Predict Obstructive ..:

Kim, Yunsoo ; Park, June-Young ; Jang, Yeji...
SLEEP. 47 (2024) Supplement_1 - p. A218-A218 , 2024

Link: https://doi.org/10.1093/..