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Patommel, J.
57
results:
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Online (57)
Mediatypes
Articles (Online) (33)
OpenAccess-fulltext (23)
Thesis (Online) (1)
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english (48)
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1
High-Resolution Phase-Contrast Imaging at XFELs:
Schropp, A.
;
Hoppe, R.
;
Meier, V.
...
Microscopy and Microanalysis. 21 (2015) S3 - p. 2167-2168 , 2015
Link:
https://doi.org/10.1017/..
?
2
Hard x-ray nanofocusing by refractive lenses of constant th..:
Seiboth, F.
;
Scholz, M.
;
Patommel, J.
...
Applied Physics Letters. 105 (2014) 13 - p. , 2014
Link:
https://doi.org/10.1063/..
?
3
High-resolution chemical imaging of gold nanoparticles usin..:
Hoppe, R.
;
Reinhardt, J.
;
Hofmann, G.
...
Applied Physics Letters. 102 (2013) 20 - p. , 2013
Link:
https://doi.org/10.1063/..
?
4
Hard x-ray scanning microscopy with coherent radiation: Bey..:
Schropp, A.
;
Hoppe, R.
;
Patommel, J.
...
Applied Physics Letters. 100 (2012) 25 - p. , 2012
Link:
https://doi.org/10.1063/..
?
5
Coherent X‐ray nanodiffraction on single GaAs nanowires:
Gulden, J.
;
Mariager, S. O.
;
Mancuso, A. P.
...
physica status solidi (a). 208 (2011) 11 - p. 2495-2498 , 2011
Link:
https://doi.org/10.1002/..
?
6
Front Cover: Coherent X‐ray nanodiffraction on single GaAs ..:
Gulden, J.
;
Mariager, S. O.
;
Mancuso, A. P.
...
physica status solidi (a). 208 (2011) 11 - p. , 2011
Link:
https://doi.org/10.1002/..
?
7
X-ray nanodiffraction at individual SiGe/Si(001) dot molecu..:
Dubslaff, M.
;
Hanke, M.
;
Schöder, S.
...
Applied Physics Letters. 96 (2010) 13 - p. , 2010
Link:
https://doi.org/10.1063/..
?
8
Hard x-ray nanobeam characterization by coherent diffractio..:
Schropp, A.
;
Boye, P.
;
Feldkamp, J. M.
...
Applied Physics Letters. 96 (2010) 9 - p. , 2010
Link:
https://doi.org/10.1063/..
?
9
Non-destructive and quantitative imaging of a nano-structur..:
SCHROPP, A.
;
BOYE, P.
;
GOLDSCHMIDT, A.
...
Journal of Microscopy. 241 (2010) 1 - p. 9-12 , 2010
Link:
https://doi.org/10.1111/..
?
10
Coherent X-Ray Diffraction Imaging with Nanofocused Illumin..:
Schroer, C. G.
;
Boye, P.
;
Feldkamp, J. M.
...
Physical Review Letters. 101 (2008) 9 - p. , 2008
Link:
https://doi.org/10.1103/..
?
11
Scanning x-ray diffraction with 200nm spatial resolution:
Hanke, M.
;
Dubslaff, M.
;
Schmidbauer, M.
...
Applied Physics Letters. 92 (2008) 19 - p. , 2008
Link:
https://doi.org/10.1063/..
?
12
Compact x-ray microtomography system for element mapping an..:
Feldkamp, J. M.
;
Schroer, C. G.
;
Patommel, J.
...
Review of Scientific Instruments. 78 (2007) 7 - p. , 2007
Link:
https://doi.org/10.1063/..
?
13
Hard X-ray nanoprobe with refractive X-ray lenses:
Schroer, C. G.
;
Kurapova, O.
;
Patommel, J.
...
Acta Crystallographica Section A Foundations of Crystallography. 62 (2006) a1 - p. s93-s93 , 2006
Link:
https://doi.org/10.1107/..
?
14
Hard X-ray nanoprobe with refractive X-ray lenses:
Schroer, C.
;
Kurapova, O.
;
Patommel, J.
...
Acta Crystallographica Section A Foundations of Crystallography. 61 (2005) a1 - p. c64-c65 , 2005
Link:
https://doi.org/10.1107/..
?
15
Hard x-ray nanoprobe based on refractive x-ray lenses:
Schroer, C. G.
;
Kurapova, O.
;
Patommel, J.
...
Applied Physics Letters. 87 (2005) 12 - p. , 2005
Link:
https://doi.org/10.1063/..
1-15