E-LIB Suche - Ergebnisse für: Payel Chatterjee

1

A Generic Trap Generation Framework for MOSFET Reliability—..:

Mahapatra, Souvik ; Ansari, Aseer ; Bisht, Arnav Shaurya...
IEEE Transactions on Electron Devices. 71 (2024) 1 - p. 114-125 , 2024

Link: https://doi.org/10.1109/..

2

Impact of Gate Insulator Process on NBTI in FinFETs and Res..:

, In: 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),

Bisht, Arnav Shaurya ; Chatterjee, Payel ; Mahapatra, Souvik - p. 1-3 , 2024

Link: https://doi.org/10.1109/..

3

Identification of a macrocyclic compound targeting the lass..:

Aida-Ficken, Virginia ; Kelly, Jamie A. ; Chatterjee, Payel...
Antiviral Research. 228 (2024) - p. 105923 , 2024

Link: https://doi.org/10.1016/..

4

A Generic Framework for MOSFET Reliability—Part II: Gate an..:

Mahapatra, Souvik ; Diwakar, Himanshu ; Thakor, Karansingh...
IEEE Transactions on Electron Devices. 71 (2024) 1 - p. 126-137 , 2024

Link: https://doi.org/10.1109/..

5

Case report: ex vivo tumor organoid drug testing identifies..:

Al-Aloosi, Marwah ; Prechtl, Amanda M. ; Chatterjee, Payel...
Frontiers in Oncology. 13 (2024) - p. , 2024

Link: https://doi.org/10.3389/..

6

Examination of SARS-CoV-2 serological test results from mul..:

Lester, Sandra N. ; Stumpf, Megan ; Freeman, Brandi D....
Access Microbiology. 6 (2024) 2 - p. , 2024

Link: https://doi.org/10.1099/..

7

A Device to Circuit Reliability Framework for BTI and HCD A..:

, In: 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),

Chatterjee, Payel ; Thakor, Karan Singh ; Mahapatra, Souvik - p. 1-3 , 2024

Link: https://doi.org/10.1109/..

8

A TCAD to SPICE Framework for Isolation of BTI and HCD in G..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),

Thakor, Karansingh ; Chatterjee, Payel ; Mahapatra, Souvik - p. 1-6 , 2024

Link: https://doi.org/10.1109/..

9

Extraordinary clinical response to ibrutinib in low-grade o..:

Gray, Heidi J. ; Chatterjee, Payel ; Rosati, Rachele...
npj Precision Oncology. 7 (2023) 1 - p. , 2023

Link: https://doi.org/10.1038/..

10

A Device to Circuit Framework for NBTI:

, In: 2023 IEEE International Integrated Reliability Workshop (IIRW),

Chatterjee, Payel ; Thakor, Karansingh ; Bisht, Arnav Shaurya... - p. 1-6 , 2023

Link: https://doi.org/10.1109/..

11

Surface Morphology and Exchange Bias Anisotropy Studies in ..:

Raja, M. Manivel ; Chatterjee, Payel ; Basumatary, Himalaya
Defence Science Journal. 73 (2023) 2 - p. 201-211 , 2023

Link: https://doi.org/10.14429..

12

CARAT – A reliability analysis framework for BTI-HCD aging ..:

Gholve, Prasad ; Chatterjee, Payel ; Pasupuleti, Chaitanya...
Solid-State Electronics. 201 (2023) - p. 108586 , 2023

Link: https://doi.org/10.1016/..

13

Pharmacological NF‐κB inhibition decreases cisplatin chemor..:

Gil da Costa, Rui M. ; Levesque, Christine ; Bianchi‐Frias, Daniella...
Molecular Oncology. 17 (2023) 12 - p. 2709-2727 , 2023

Link: https://doi.org/10.1002/..

14

Development of a novel minigenome and recombinant VSV expre..:

Shrivastava-Ranjan, Punya ; Jain, Shilpi ; Chatterjee, Payel...
Antiviral Research. 214 (2023) - p. 105619 , 2023

Link: https://doi.org/10.1016/..

15

The Histone Methyl Transferase (SUV39H1) Promotes Smooth Mu..:

Chatterjee, Payel ; Chakraborty, Raja ; Xie, Yi...
JVS-Vascular Science. 3 (2022) - p. 403 , 2022

Link: https://doi.org/10.1016/..