Payet, Anthony
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1

Full Chip Stress Model for Flash BEOL Crack Failure Risk An..:

, In: 2023 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD),
Yeom, Kyungmi ; Yoo, Geunsang ; Payet, Anthony... - p. 29-32 , 2023
 
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3

Damage accumulation during cryogenic and room temperature i..:

Payet, Anthony ; Luce, Flavia Piegas ; Curfs, Caroline...
Materials Science in Semiconductor Processing.  42 (2016)  - p. 247-250 , 2016
 
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12

Contributors:

, In: Cell Physiology Source Book,
 
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13

Risk factors associated with myasthenia gravis in thymoma p..:

Lefeuvre, Claire Mj ; Payet, Cloé ; Fayet, Odessa-Maud...
info:eu-repo/semantics/altIdentifier/doi/10.1016/j.jaut.2019.102337.  , 2020
 
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14

Risk factors associated with myasthenia gravis in thymoma p..:

Lefeuvre, Claire Mj ; Payet, Cloé ; Fayet, Odessa-Maud...
info:eu-repo/semantics/altIdentifier/doi/10.1016/j.jaut.2019.102337.  , 2020
 
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15

Risk factors associated with myasthenia gravis in thymoma p..:

Lefeuvre, Claire Mj ; Payet, Cloé ; Fayet, Odessa-Maud...
info:eu-repo/semantics/altIdentifier/doi/10.1016/j.jaut.2019.102337.  , 2020
 
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