Paz, Bruna Cardoso
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3

Electrical characterization and modeling of FDSOI MOSFETs f..:

, In: 2022 IEEE 15th Workshop on Low Temperature Electronics (WOLTE),
 
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4

Statistical and Electrical Modeling of FDSOI Four-Gate Qubi..:

Catapano, Edoardo ; Ghibaudo, Gerard ; Casse, Mikael...
IEEE Journal of the Electron Devices Society.  9 (2021)  - p. 582-590 , 2021
 
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Integrated Variability Measurements of 28 nm FDSOI MOSFETs ..:

, In: 2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS),
 
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Impact of substrate bias on the mobility of n-type ɷ-gate S..:

, In: 2019 34th Symposium on Microelectronics Technology and Devices (SBMicro),
 
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