Pearton, S. J.
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1

Electronic properties of dopants and defects in widegap and..:

, In: Reference Module in Materials Science and Materials Engineering,
Pearton, S.J. , 2024
 
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8

Trap States and Carrier Diffusion in Czochralski (100) Sing..:

Nikolaev, V. I. ; Polyakov, A. Y. ; Krymov, V. M....
ECS Journal of Solid State Science and Technology.  13 (2024)  1 - p. 015003 , 2024
 
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9

Mechanism for Long Photocurrent Time Constants in α-Ga2O3 U..:

Polyakov, A. Y. ; Almaev, A. V. ; Nikolaev, V. I....
ECS Journal of Solid State Science and Technology.  12 (2023)  4 - p. 045002 , 2023
 
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13

1 mm2, 3.6 kV, 4.8 A NiO/Ga2O3 Heterojunction Rectifiers:

Li, Jian-Sian ; Chiang, Chao-Ching ; Xia, Xinyi...
ECS Journal of Solid State Science and Technology.  12 (2023)  8 - p. 085001 , 2023
 
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14

HVPE Growth and Characterization of Thick κ-Ga2O3 layers on..:

Stepanov, S. I. ; Nikolaev, V. I. ; Polyakov, A. Y....
ECS Journal of Solid State Science and Technology.  12 (2023)  1 - p. 015002 , 2023
 
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15

Carrier removal rates in 1.1 MeV proton irradiated α-Ga2O3 ..:

Polyakov, A Y ; Nikolaev, V I ; Pechnikov, A I...
Journal of Physics D: Applied Physics.  56 (2023)  30 - p. 305103 , 2023
 
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