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Perepa, Pavitra Ramadevi
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1

Impact of Barrier Metal Thickness on SRAM Reliability:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),
Ranjan, Rakesh ; Perepa, Pavitra Ramadevi ; Lee, Ki-Don... - p. 1-6 , 2023
Link: https://doi.org/10.1109/..
 
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2

Systematic Study of Process Impact on FinFET Reliability:

, In: 2021 IEEE International Reliability Physics Symposium (IRPS),
Ranjan, Rakesh ; Lee, Ki-Don ; Mahmud, Md Iqbal... - p. 1-5 , 2021
Link: https://doi.org/10.1109/..
 
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3

A Systematic Study of HCI Improvement in FinFET with Source..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),
Ranjan, Rakesh ; Perepa, Pavitra R. ; Lee, Ki-Don... - p. 5A.1-1-5A.1-6 , 2024
Link: https://doi.org/10.1109/..
 
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4

Trap Density Modulation for IO FinFET NBTI Improvement:

, In: 2020 IEEE International Reliability Physics Symposium (IRPS),
Ranjan, Rakesh ; LaRow, Charles B. ; Lee, Ki-Don... - p. 1-5 , 2020
Link: https://doi.org/10.1109/..
 
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