I agree that this site is using cookies. You can find further informations here.
X
Pergoot, A.
4  results:
Search for persons X
?
1

A new degradation model and lifetime extrapolation techniqu..:

Dreesen, R. ; Croes, K. ; Manca, J....
Microelectronics Reliability.  41 (2001)  3 - p. 437-443 , 2001
Link: https://doi.org/10.1016/..
 
?
2

Modelling hot-carrier degradation of LDD NMOSFETs by using ..:

Dreesen, R. ; Croes, K. ; Manca, J....
Microelectronics Reliability.  39 (1999)  6-7 - p. 785-790 , 1999
Link: https://doi.org/10.1016/..
 
?
3

The influence of addition elements on the early resistance ..:

De Ceuninck, W.A ; D'Haeger, V ; Van Olmen, J...
Microelectronics Reliability.  38 (1998)  1 - p. 87-98 , 1998
Link: https://doi.org/10.1016/..
 
?
4

Bias temperature reliability of p-channel high-voltage devi..:

Demesmaeker, A. ; Pergoot, A. ; De Pauw, P.
Microelectronics Reliability.  37 (1997)  10-11 - p. 1767-1770 , 1997
Link: https://doi.org/10.1016/..
 
1-4