E-LIB Suche - Ergebnisse für: Pey, K. L.

1

Statistical modeling of degradation behavior in Split-Gate ..:

Mei, S. ; Luo, L. ; Shubhakar, K...
Solid-State Electronics. 211 (2024) - p. 108817 , 2024

Link: https://doi.org/10.1016/..

2

Estimating the Number of Defects in a Single Breakdown Spot..:

Ranjan, A. ; Padovani, A. ; Dianat, B....
IEEE Electron Device Letters. 45 (2024) 5 - p. 809-812 , 2024

Link: https://doi.org/10.1109/..

3

Backhopping-based STT-MRAM Poisson Spiking Neuron for Neuro..:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),

Tan, J. ; Lim, J.H. ; Kwon, J.H.... - p. 1-6 , 2023

Link: https://doi.org/10.1109/..

4

Super-resolution laser probing of integrated circuits using..:

Ravikumar, V. K. ; Chin, Jiann Min ; Lua, Winson...
Nature Communications. 13 (2022) 1 - p. , 2022

Link: https://doi.org/10.1038/..

5

Role of temperature, MTJ size and pulse-width on STT-MRAM b..:

Tan, J. ; Lim, J.H. ; Kwon, J.H....
Solid-State Electronics. 183 (2021) - p. 108032 , 2021

Link: https://doi.org/10.1016/..

6

Correlation of Dielectric Breakdown and Nanoscale Adhesion ..:

, In: 2020 IEEE International Reliability Physics Symposium (IRPS),

Ranjan, A. ; O'Shea, S. J. ; Bosman, M.... - p. 1-7 , 2020

Link: https://doi.org/10.1109/..

7

A transformative engineering and architecture education:

, In: 2020 IEEE Frontiers in Education Conference (FIE),

Pey, K. L. ; Blessing, Lucienne ; Tuncer, Bige - p. 1-4 , 2020

Link: https://doi.org/10.1109/..

8

Origins and Signatures of Tail Bit Failures in Ultrathin Mg..:

, In: 2020 IEEE International Reliability Physics Symposium (IRPS),

Lim, J. H. ; Raghavan, N. ; Kwon, J. H.... - p. 1-5 , 2020

Link: https://doi.org/10.1109/..

9

Reliability and Breakdown Study of Erase Gate Oxide in Spli..:

, In: 2020 IEEE International Reliability Physics Symposium (IRPS),

Luo, L. ; Shubhakar, K. ; Mei, S.... - p. 1-6 , 2020

Link: https://doi.org/10.1109/..

10

3D characterization of hard breakdown in RRAM device:

Mei, S. ; Bosman, M. ; Shubhakar, K....
Microelectronic Engineering. 216 (2019) - p. 111042 , 2019

Link: https://doi.org/10.1016/..

11

The interplay between drift and electrical measurement in c..:

Ranjan, A. ; Pey, K. L. ; O'Shea, S. J.
Review of Scientific Instruments. 90 (2019) 7 - p. , 2019

Link: https://doi.org/10.1063/..

12

Understanding spatial resolution of laser voltage imaging:

Ravikumar, V.K. ; Lim, G. ; Chin, J.M...
Microelectronics Reliability. 88-90 (2018) - p. 255-261 , 2018

Link: https://doi.org/10.1016/..

13

Pulsed Laser Annealing Technology for Nano-Scale Fabricatio..:

, In: Advances in Laser Materials Processing,

Pey, K.L. ; Lee, P.S. - p. 299-337 , 2018

Link: https://doi.org/10.1016/..

14

Contributors:

, In: Advances in Laser Materials Processing,

Acherjee, B. ; Ahad, I.U. ; Akinlabi, E.T.... - p. xv-xviii , 2018

Link: https://doi.org/10.1016/..

15

Random telegraph noise in 2D hexagonal boron nitride dielec..:

Ranjan, A. ; Puglisi, F. M. ; Raghavan, N....
Applied Physics Letters. 112 (2018) 13 - p. , 2018

Link: https://doi.org/10.1063/..