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Pflanzl, Walter
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Low TID Effects on MOS Transistors:

, In: 2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS),
Bezhenova, Varvara ; Michalowska-Forsyth, Alicja ; Pflanzl, Walter - p. 1-4 , 2018
Link: https://doi.org/10.1109/..
 
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Methodology for 1/f noise parameter extraction for high-vol..:

Mavredakis, Nikolaos ; Pflanzl, Walter ; Seebacher, Ehrenfried.
Solid-State Electronics.  103 (2015)  - p. 202-208 , 2015
Link: https://doi.org/10.1016/..
 
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