E-LIB Suche - Ergebnisse für: Pinard, Philippe T.

1

Electron probe microanalysis: A review of recent developmen..:

Llovet, Xavier ; Moy, Aurélien ; Pinard, Philippe T..
Progress in Materials Science. 116 (2021) - p. 100673 , 2021

Link: https://doi.org/10.1016/..

2

Reprint of: Electron probe microanalysis: A review of recen..:

Llovet, Xavier ; Moy, Aurélien ; Pinard, Philippe T..
Progress in Materials Science. 120 (2021) - p. 100818 , 2021

Link: https://doi.org/10.1016/..

3

X-ray Microanalysis at High Count Rate with Latest Generati..:

Pinard, Philippe T. ; Burgess, Simon ; Zhang, John Qing..
Microscopy and Microanalysis. 24 (2018) S1 - p. 724-725 , 2018

Link: https://doi.org/10.1017/..

4

Joy of Scanning with Electron and X-ray Imaging:

Pinard, Philippe T. ; Burgess, Simon ; Hyde, Anthony..
Microscopy and Microanalysis. 24 (2018) S1 - p. 624-625 , 2018

Link: https://doi.org/10.1017/..

5

Electron probe microanalysis of carbon containing steels at..:

Pinard, Philippe T. , 2016

Link: http://nbn-resolving.de/..

6

Electron Probe Microanalysis of Ni Silicides Using Ni-L X-R..:

Llovet, Xavier ; Pinard, Philippe T. ; Heikinheimo, Erkki..
Microscopy and Microanalysis. 22 (2016) 6 - p. 1389-1389 , 2016

Link: https://doi.org/10.1017/..

7

Electron Probe Microanalysis of Ni Silicides Using Ni-L X-R..:

Llovet, Xavier ; Pinard, Philippe T. ; Heikinheimo, Erkki..
Microscopy and Microanalysis. 22 (2016) 6 - p. 1233-1243 , 2016

Link: https://doi.org/10.1017/..

8

Spectral Deconvolution and Quantification in EDS Using Low ..:

Terborg, Ralf ; Salge, Tobias ; Pinard, Philippe T..
Microscopy and Microanalysis. 22 (2016) S3 - p. 404-405 , 2016

Link: https://doi.org/10.1017/..

9

Multi-beam energy acquisition in FE-EPMA:

Richter, Silvia ; Pinard, Philippe T.
Microscopy and Microanalysis. 21 (2015) S3 - p. 1441-1442 , 2015

Link: https://doi.org/10.1017/..

10

Evaluation of Combined Quantification of Cr-Ni Steel using ..:

Pinard, Philippe T. ; Terborg, Ralf ; Salge, Tobias.
Microscopy and Microanalysis. 21 (2015) S3 - p. 1879-1880 , 2015

Link: https://doi.org/10.1017/..

11

Quantitative image analysis of white etching areas in SAE52..:

Pinard, Philippe T. ; Özel, Mehmet ; Ploß, Moritz.
Microscopy and Microanalysis. 21 (2015) S3 - p. 459-460 , 2015

Link: https://doi.org/10.1017/..

12

Analytical Challenges and Strategies in FE-EPMA:

Richter, Silvia ; Pinard, Philippe T.
Microscopy and Microanalysis. 20 (2014) S3 - p. 680-681 , 2014

Link: https://doi.org/10.1017/..

13

Application of Monte Carlo Calculations to Improve Quantita..:

Llovet, Xavier ; Pinard, Philippe T. ; Salvat, Francesc
Microscopy and Microanalysis. 20 (2014) S3 - p. 708-709 , 2014

Link: https://doi.org/10.1017/..

14

Towards Reliable Quantification of Steel Alloys at Low Volt..:

Pinard, Philippe T. ; Heikinheimo, Erkki ; Llovet, Xavier.
Microscopy and Microanalysis. 20 (2014) S3 - p. 700-701 , 2014

Link: https://doi.org/10.1017/..

15

Characterization of Dual-Phase Steel Microstructure by Comb..:

Pinard, Philippe T. ; Schwedt, Alexander ; Ramazani, Ali..
Microscopy and Microanalysis. 19 (2013) 4 - p. 996-1006 , 2013

Link: https://doi.org/10.1017/..