E-LIB Suche - Ergebnisse für: Piplits, K.

1

Dose-rate dependence of damage formation in Si by N implant..:

Otto, G. ; Hobler, G. ; Palmetshofer, L....
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 242 (2006) 1-2 - p. 667-669 , 2006

Link: https://doi.org/10.1016/..

2

Multiscale approach for the analysis of channeling profile ..:

Hobler, G. ; Otto, G. ; Kovač, D....
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 228 (2005) 1-4 - p. 360-363 , 2005

Link: https://doi.org/10.1016/..

3

Investigations of corrosion phenomena on gold coins with SI..:

Mayerhofer, K.E. ; Piplits, K. ; Traum, R...
Applied Surface Science. 252 (2005) 1 - p. 133-138 , 2005

Link: https://doi.org/10.1016/..

4

Range evaluation in SIMS depth profiles of Er-implantations..:

Mayerhofer, K. ; Foisner, H. ; Piplits, K....
Applied Surface Science. 252 (2005) 1 - p. 271-277 , 2005

Link: https://doi.org/10.1016/..

5

Characterization of carbon-boronnitride-coatings prepared w..:

Gammer, K. ; Kolber, T. ; Piplits, K....
Thin Solid Films. 406 (2002) 1-2 - p. 98-102 , 2002

Link: https://doi.org/10.1016/..

6

SIMS investigation of MoS2 based sputtercoatings:

Heinisch, C ; Piplits, K ; Kubel, F...
Applied Surface Science. 179 (2001) 1-4 - p. 269-274 , 2001

Link: https://doi.org/10.1016/..

7

SIMS analysis of the oxidation behaviour of SiFeCr coated t..:

Gritsch, M. ; Piplits, K. ; Hutter, H...
Materials and Corrosion. 52 (2001) 7 - p. 501-508 , 2001

Link: https://doi.org/10.1002/..

8

SIMS: a capable method for BCN quantification:

Kolber, T ; Piplits, K ; Dreer, S...
Applied Surface Science. 167 (2000) 1-2 - p. 79-88 , 2000

Link: https://doi.org/10.1016/..

9

Investigations on the oxidation behavior of technical molyb..:

Gritsch, M. ; Piplits, K. ; Hutter, H....
Surface Science. 454-456 (2000) - p. 284-288 , 2000

Link: https://doi.org/10.1016/..

10

Quantitative investigation of boron incorporation in polycr..:

Kolber, T. ; Piplits, K. ; Haubner, R..
Fresenius' Journal of Analytical Chemistry. 365 (1999) 8 - p. 636-641 , 1999

Link: https://doi.org/10.1007/..

11

Optical Er-doping of Si during sublimational molecular beam..:

Andreev, B.A ; Andreev, A.Yu ; Ellmer, H...
Journal of Crystal Growth. 201-202 (1999) - p. 534-537 , 1999

Link: https://doi.org/10.1016/..

12

Application of scanning SIMS techniques for the evaluation ..:

Gritsch, M. ; Brunner, C. ; Piplits, K....
Fresenius' Journal of Analytical Chemistry. 365 (1999) 1-3 - p. 188-194 , 1999

Link: https://doi.org/10.1007/..

13

Optically active layers of silicon doped with erbium during..:

Andreev, A. Yu. ; Andreev, B. A. ; Drozdov, M. N....
Semiconductors. 33 (1999) 2 - p. 131-134 , 1999

Link: https://doi.org/10.1134/..

14

Investigation of non-metallic impurities in High Speed Stee..:

Brunner, C. ; Hutter, H. ; Piplits, K....
Fresenius' Journal of Analytical Chemistry. 361 (1998) 6-7 - p. 667-671 , 1998

Link: https://doi.org/10.1007/..

15

Investigation of the synthesis and internal structure of pr..:

Brunner, C. ; Hutter, H. ; Piplits, K....
Fresenius' Journal of Analytical Chemistry. 358 (1997) 1-2 - p. 233-236 , 1997

Link: https://doi.org/10.1007/..